Method and system for observing all signals inside programmable digital IC chip

A technology for integrated circuits and test systems, which is applied in the field of testing and verification of programmable digital integrated circuit chips, and can solve problems such as short waveform length, errors, and inability to be used in ASICs.

Inactive Publication Date: 2004-06-23
长江微电子技术(大连)有限公司
View PDF0 Cites 5 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In order to save the output of all memory, it takes a lot of on-chip resources
[0007] (2) Because it takes up a lot of on-chip resources, the functions that can be realized by the FPGA chip are very small, and the operating frequency is also very low.
[0008] (3) Since the on-chip memory cannot be made very large, the length of the savea...

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method and system for observing all signals inside programmable digital IC chip
  • Method and system for observing all signals inside programmable digital IC chip
  • Method and system for observing all signals inside programmable digital IC chip

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0054] The present invention will be further described below in conjunction with the accompanying drawings and embodiments.

[0055] The composition of the entire test system, such as Figure 4 As shown, the host computer can be a microcomputer or a workstation, and the preprocessing program, postprocessing program, software emulator and system control program all run on the host computer. The test system composed of back-end chip, "signal, delay and storage module" and "clock, trigger and stop logic" is installed in a separate chassis, and it is connected to the microcomputer through PCI bus or USB bus. The front-end chip is installed on the circuit board under test to realize real-time and online testing. Cables are used between the front-end chip and the test system to send the signals on the pins of all the front-end chips to the chassis of the test system. In order to increase the transmission rate of cables, it is necessary to expand the number of cables and distribute...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The present invention is method for real-time and on-line observing all the signal waveforms inside programmable digital IC chip, including various types of memory chip. The observing point may be any time after the measured system begins to operate, and the length of signal waveform to be collected is not limited by the internal resource of the programmable digital IC chip. The design of the digital IC is written into two identical programmable digital IC chips with similar operation process but a time difference of N clocks and capable of being stopped in any time instant. The states of chip registers and memories in the stop time may be read out and are combined with the signals collected from the chip pins to predict the state signals of the combination circuit inside the chip. Further processing of these data can obtain the waveforms of all the signals inside the chip.

Description

technical field [0001] The invention relates to the testing and verification of programmable digital integrated circuit chips, in particular to a method and system capable of observing the waveforms of all signals inside the programmable digital integrated circuit chip in real time and on-line. The method and system can be used both as a logic analyzer for testing circuit boards and as a hardware emulator for verifying IC designs. Background technique [0002] With the development of semiconductor integrated circuit technology, the integration of chips is higher, and the functions of programmable digital integrated circuit chips are more complex. Programmable application-specific integrated circuits (ASICs), field programmable gate arrays (FPGAs) and programmable logic devices ( PLD) is very popular, and there is a system on a chip (SOC) (System On a Chip), which integrates the entire system on a chip, not only has CPU, memory and I / O interface, but also complex algorithm mo...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G01R31/28G11C29/00H01L21/66
Inventor 刘建光
Owner 长江微电子技术(大连)有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products