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Emission spectrum background correction method

A background correction and emission spectrum technology, applied in the field of chemical measurement, can solve problems such as background spectrum time or sample solution changes, and achieve the effects of reducing application difficulty, improving measurement accuracy, and improving accuracy

Inactive Publication Date: 2017-09-15
浙江全世科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0009] The purpose of the present invention is to provide a method for emission spectrum background correction to overcome the problem that the traditional peak method cannot effectively solve the problem that the background spectrum changes with time or sample solution mentioned in the background technology

Method used

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  • Emission spectrum background correction method

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Experimental program
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Embodiment 1

[0044] Such as figure 1 As shown, this embodiment provides a method for emission spectrum background correction. The method performs adaptive background subtraction on the actual sample spectrum according to the blank background spectrum to obtain a clean signal spectrum, which specifically includes the following steps:

[0045] S1: Acquisition of blank background spectrum I blank , including m spectrogram data;

[0046] S2: Acquisition of sample spectrum I with continuous background interference sample , including m spectrogram data corresponding to the spectrogram data of the blank background spectrogram;

[0047] S3: Spectrum I from the sample sample Screening n as sample background spectral data I sa,bg , and from the blank background spectrum I blank Select the corresponding n data as the blank background spectral data I for calibration bl,bg , where n≤m, m and n are positive integers;

[0048] S4: According to the sample background spectral data I sa,bg And calibra...

Embodiment 2

[0063] This embodiment explains in detail the operation process involved in the method of the present invention according to a specific example. In this embodiment, a method of screening the original data, performing linear fitting by the least square method, and Example of background correction of sample spectra.

[0064] First, collect the blank background spectrum I separately blank with sample spectrum I sample The data, what table 1 provided is the blank background spectrogram I collected by step S1 and step S2 blank with sample spectrum I sample data, where λ represents the wavelength, and the number of spectrogram data is m=10.

[0065] Table 1 Blank Background Spectrum I blank with sample spectrum I sample The data

[0066] lambda

1

2

3

4

5

6

7

8

9

10

I blank

2.40

3.00

1.60

4.00

3.00

2.50

2.20

2.70

3.10

2.00

I sample

3.05

3.59

2.10

7.56

10.49

6.49

2.74

3.11...

Embodiment 3

[0078] This embodiment explains in detail the operation process involved in the method of the present invention according to a specific example. In this embodiment, a method for linear fitting by weighted least square method and background correction for the sample spectrum will be given. instance of .

[0079] First, collect the blank background spectrum I separately blank with sample spectrum I sample The data. What table 4 provided is by step 1) and step 2) the blank background spectrogram I that gathers blank with sample spectrum I sample , where λ represents the wavelength, and the number of spectrogram data m=10.

[0080] Table 4 Blank Background Spectrum I blank with sample spectrum I sample The data

[0081] lambda

1

2

3

4

5

6

7

8

9

10

I blank

2.40

3.00

1.60

4.00

3.00

2.50

2.20

2.70

3.10

2.00

I sample

3.05

3.59

2.10

7.56

10.49

6.49

2.74

3.11

3.78

2.4...

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Abstract

The invention provides an emission spectrum background correction method, which includes the following steps: a blank background spectrogram, which includes m spectrogram data, is acquired; a sample spectrogram with continuous background interference, which includes m spectrogram data corresponding to the spectrogram data of the blank background spectrogram, is acquired; n sample background spectrum data are screened from the sample spectrogram, n corresponding data are screened from the blank background spectrogram to serve as blank background spectrum data for correction, m is greater than or equal to n, and m and n are positive integers; according to the sample background spectrum data and the blank background spectrum data for correction, fitting is carried out, so that a correction relation is obtained; the blank background spectrogram is inputted into the correction relation to carry out correction, so that an estimated background of a sample is obtained; the estimated background is subtracted from the sample spectrogram, and thereby a clean signal spectrogram is obtained. By sampling and fitting background spectrogram intensity, the method obtains the correction relation to correct the background spectrogram, and after the corrected background spectrogram is subtracted, the measuring precision of the obtained signal spectrogram is greatly increased.

Description

technical field [0001] The invention relates to the technical field of chemical measurement, in particular to a method for emission spectrum background correction. It can be applied, for example, to inductively coupled plasma, microwave chemi-emission spectroscopy. Background technique [0002] In emission spectroscopic analysis, it is usually necessary to establish the relationship between the concentration of the sample and the emission intensity of the spectral line, and calculate the concentration of the component to be measured in the measured sample according to the standard curve to achieve quantitative analysis. When establishing a standard curve, it is usually desired to obtain the net signal of the emission intensity of the spectral line, that is, the intensity value only related to the concentration of the analyte. But in practice, the directly acquired spectral data is superimposed on the background spectrum. Due to the additivity of the emission spectral data,...

Claims

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Application Information

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IPC IPC(8): G01N21/25
Inventor 于丙文陈挺徐晨郑磊落
Owner 浙江全世科技有限公司