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Cross-project defect prediction method based on data screening and data oversampling

A prediction method and data screening technology, applied in the direction of electrical digital data processing, error detection/correction, software testing/debugging, etc., can solve the problem of damage to the performance of cross-project software defect prediction models, cross-project historical software module data class imbalance, etc. problem, to achieve performance-enhancing effects

Inactive Publication Date: 2017-11-24
WUHAN UNIV
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Problems solved by technology

[0009] Compared with the existing cross-project software defect prediction methods at home and abroad, the present invention aims at the problem that a large number of irrelevant cross-project historical software module data in the cross-project software defect prediction damage the performance of the cross-project software defect prediction model and cross-project historical software modules For the problem of data class imbalance, a cross-project defect prediction method based on data screening and data oversampling is proposed

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  • Cross-project defect prediction method based on data screening and data oversampling
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  • Cross-project defect prediction method based on data screening and data oversampling

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[0024] In order to facilitate those of ordinary skill in the art to understand and implement the present invention, the present invention will be described in further detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the implementation examples described here are only used to illustrate and explain the present invention, and are not intended to limit this invention.

[0025] please see figure 1 A cross-project defect prediction method based on data screening and data oversampling provided by the present invention comprises the following steps:

[0026] Step 1: Extract cross-project historical software modules;

[0027] When a project is just being developed, the defect prediction model for this project cannot be trained because there is no historical software module data. Therefore, it is necessary to borrow cross-project historical software module data. Therefore, useful cross-project historical software modules are ex...

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Abstract

The invention discloses a cross-project defect prediction method based on data screening and data oversampling. Reasonable data screening and data imbalance processing strategies are designed, and cross-project historical software module data truly similar to the project module data is screened by means of a hierarchical clustering algorithm, so that a cross-project software defect prediction model is protected from the influence of irrelevant cross-project historical software module data; then by means of an oversampling method, defective software module data is added, and a new dataset with relatively balanced classification is obtained, so that the cross-project software defect prediction model is protected from the influence of an imbalanced training dataset. According to the technical scheme, the method has the advantages of being simple and efficient, and the performance of the cross-project software defect prediction model can be well improved.

Description

technical field [0001] The invention belongs to the technical field of software defect prediction, in particular to a cross-project defect prediction method based on data screening and data oversampling. Background technique [0002] (1) Software defect prediction technology [0003] Software has become an important factor affecting national economy, military affairs, politics and even social life. Highly reliable and complex software systems depend on the reliability of the software they employ. Software defects are the potential source of related system errors, failures, crashes, and even machine crashes. The so-called defect, so far, there are many related terms and definitions in academia and industry, such as failure, defect, bug, error, error, failure, failure, etc. According to ISO 9000, the definition of a defect is: to meet the requirements related to the intended or specified use. A defect is a part of the software that already exists and can be eliminated by mo...

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Application Information

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IPC IPC(8): G06F11/36
CPCG06F11/3608
Inventor 余啸刘进伍蔓崔晓晖张建升井溢洋
Owner WUHAN UNIV
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