Device and method for measuring transmittance and transmittance uniformity of hemispherical optical element

A technology of optical components and measuring devices, applied in transmittance measurement and other directions, can solve the problems of transmittance measurement errors, light deflection, and inability to fully collect transmitted light, and achieve the effect of uniform sampling and high degree of automation

Active Publication Date: 2017-11-28
SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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AI Technical Summary

Problems solved by technology

[0003] (1) Due to the deflection of the incident light when it passes through the hemispherical optical element, the detector of the spectrophotometer cannot completely collect the transmitted light, which will cause an error in the measurement of the transmittance
[0004] (2) The uniformity of transmittance within the full aperture of the hemispherical optical element is an important technical index, but the spectrophotometer can only measure the transmittance at one position of the optical element, so it cannot determine the transmittance of the hemispherical optical element. Uniformity for Characterization

Method used

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  • Device and method for measuring transmittance and transmittance uniformity of hemispherical optical element
  • Device and method for measuring transmittance and transmittance uniformity of hemispherical optical element
  • Device and method for measuring transmittance and transmittance uniformity of hemispherical optical element

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Embodiment 1

[0073] figure 2 and image 3 Based on the idea of ​​the patent of the present invention, the structural diagram of the hemispherical optical element transmittance and its uniformity measurement system is constructed. The supercontinuum laser adopts FemtoPower FP1060-20 supercontinuum fiber laser, and the monochromator adopts the grating produced by Photon etc. The monochromator, the attenuation film adopts the adjustable optical attenuation film of Thorlabs Company, the beam splitter adopts the pellicle beam splitter installed in the CM1-BP145B2 cage cube of Thorlabs Company, and the diaphragm adopts the ID20 post-mounted iris diaphragm of Thorlabs Company. Both the reference light detector and the test light detector use the PD-300 series optical power meter of Ophir Company, the multi-dimensional mechanical adjustment frame is completed by non-standard custom processing, and the stepper motor controller adopts the 3-axis controller of Shanghai Lianyi Optical Fiber Laser Ins...

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Abstract

The invention provides a device and a method for measuring transmittance and transmittance uniformity of a hemispherical optical element. The device comprises a supercontinuum source, a monochromator, an optical attenuator, a beam splitter, a reference light detector, a diaphragm, a multi-dimension mechanical adjusting rack, a to-be-measured hemispherical optical element, a stepper motor controller, a test light detector, a data collector and a computer. The device and the method have the following advantages: the technical problem that the transmittance and transmittance uniformity of the hemispherical optical element cannot be measured accurately with the traditional method is solved; measuring points are uniformly sampled, and the transmittance uniformity of the hemispherical optical element can be reflected truly; the device is high in automation degree, and one-key measurement can be realized.

Description

technical field [0001] The invention relates to the field of measuring the transmittance of an optical element, in particular to a measuring device and method for the transmittance and its uniformity in the full aperture of a hemispherical optical element. Background technique [0002] The transmittance of optical components is a very important optical parameter. At present, the common method of measuring the transmittance of optical components is to use a spectrophotometer to complete [1-3]. For flat optical components, a spectrophotometer can easily complete its transmission. However, for hemispherical optical elements (the outer surface is a hemisphere, and the interior is hollow, also hemispherical), the spectrophotometer mainly has the following problems when measuring its transmittance: [0003] (1) Since the incident light will be deflected when it passes through the hemispherical optical element, the detector of the spectrophotometer cannot completely collect the tra...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/59
CPCG01N21/59
Inventor 邵建达刘世杰王圣浩王微微周游徐天柱倪开灶鲁棋李灵巧白云波
Owner SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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