Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Labor-saving testing equipment for integrated circuit boards

A technology for integrated circuit boards and testing equipment, applied in electronic circuit testing, components of electrical measuring instruments, measuring electricity, etc., can solve the problems of inconvenient access, laborious operation, and low efficiency of the aging test seat.

Active Publication Date: 2021-03-02
浙江晶引电子科技有限公司
View PDF11 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] In order to overcome the shortcomings of inconvenient access, laborious operation, and low efficiency in the prior art, the present invention aims to solve the technical problem of providing a convenient access, labor-saving operation, and can test multiple integrated circuit boards at the same time. Labor-saving test equipment for integrated circuit boards

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Labor-saving testing equipment for integrated circuit boards
  • Labor-saving testing equipment for integrated circuit boards
  • Labor-saving testing equipment for integrated circuit boards

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0036]A labor-saving test equipment for integrated circuit boards, such asFigure 1-7As shown, it includes a bracket 1, a test seat 2, a lifting mechanism 3, a moving mechanism 4, an air cylinder 5, a first pressing rod 6, a first slide rail 27, and a first sliding block 28. The upper part of the bottom of the bracket 1 is evenly connected with a test Seat 2, the left side of the bracket 1 is provided with a lifting mechanism 3, the upper part of the bracket 1 is symmetrically connected with a first slide rail 27, and the first slide rail 27 is slidably connected with a first sliding block 28, the first sliding block 28 Cooperating with the first slide rail 27, a moving mechanism 4 is connected between the first sliding blocks 28 on the left and right sides. The bottom of the moving mechanism 4 is provided with air cylinders 5 on both front and rear sides, and the bottom of the air cylinder 5 is connected with a first pressure rod. 6.

Embodiment 2

[0038]A labor-saving test equipment for integrated circuit boards, such asFigure 1-7As shown, it includes a bracket 1, a test seat 2, a lifting mechanism 3, a moving mechanism 4, an air cylinder 5, a first pressing rod 6, a first slide rail 27, and a first sliding block 28. The upper part of the bottom of the bracket 1 is evenly connected with a test Seat 2, the left side of the bracket 1 is provided with a lifting mechanism 3, the upper part of the bracket 1 is symmetrically connected with a first slide rail 27, and the first slide rail 27 is slidably connected with a first sliding block 28, the first sliding block 28 Cooperating with the first slide rail 27, a moving mechanism 4 is connected between the first sliding blocks 28 on the left and right sides. The bottom of the moving mechanism 4 is provided with air cylinders 5 on both front and rear sides, and the bottom of the air cylinder 5 is connected with a first pressure rod. 6.

[0039]The lifting mechanism 3 includes a mounting ...

Embodiment 3

[0041]A labor-saving test equipment for integrated circuit boards, such asFigure 1-7As shown, it includes a bracket 1, a test seat 2, a lifting mechanism 3, a moving mechanism 4, an air cylinder 5, a first pressing rod 6, a first slide rail 27, and a first sliding block 28. The upper part of the bottom of the bracket 1 is evenly connected with a test Seat 2, the left side of the bracket 1 is provided with a lifting mechanism 3, the upper part of the bracket 1 is symmetrically connected with a first slide rail 27, and the first slide rail 27 is slidably connected with a first sliding block 28, the first sliding block 28 Cooperating with the first slide rail 27, a moving mechanism 4 is connected between the first sliding blocks 28 on the left and right sides. The bottom of the moving mechanism 4 is provided with air cylinders 5 on both front and rear sides, and the bottom of the air cylinder 5 is connected with a first pressure rod. 6.

[0042]The lifting mechanism 3 includes a mounting ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a testing device, in particular to a labor-saving testing device for an integrated circuit board. The technical problem to be solved by the present invention is to provide a labor-saving testing device for integrated circuit boards which is convenient to take and place, labor-saving to operate, and capable of testing multiple integrated circuit boards at the same time. In order to solve the above-mentioned technical problems, the present invention provides such a labor-saving testing device for integrated circuit boards, which includes a bracket, a test seat, a lifting mechanism, a moving mechanism, a cylinder, a first pressure rod, etc.; The left side of the bracket is provided with a lifting mechanism, the upper part of the bracket is symmetrically connected with the first slide rail, and the first slide rail is slidably connected with the first slider, and the first slider cooperates with the first slide rail. A moving mechanism is connected between the first sliders on both sides. The invention designs a labor-saving testing device for integrated circuit boards. The setting of the lifting mechanism is conducive to conveniently adjusting the heights of the cylinder and the first pressure rod, so as to test the integrated circuit boards.

Description

Technical field[0001]The invention relates to a test equipment, in particular to a labor-saving test equipment for an integrated circuit board.Background technique[0002]Electronic consumer products have entered an explosive development stage. The demand for integrated circuits such as large-capacity storage integrated circuits, camera integrated circuits, gravity sensing integrated circuits, and central processing units is unprecedented. Integrated circuit testing is an indispensable part of the entire semiconductor manufacturing process. The missing link, the demand for electronic consumer products will surely drive the demand of the IC testing industry. According to different testing purposes, integrated circuit testing can be divided into four types: verification testing, production testing, burn-in testing, and acceptance testing. The aging test seat is divided into clamshell type and top window type.[0003]The current top-window aging test seat operation method is to directly pr...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01R1/04G01R31/28
CPCG01R1/0425G01R31/2855
Inventor 周晓东张健刘超群阳冬
Owner 浙江晶引电子科技有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com