DSPI phase filtering method based on variable mode decomposition

A technique of variational mode decomposition and phase filtering, which is applied in image data processing, measuring devices, instruments, etc., can solve problems such as inability to handle noise, lack of theoretical support, and modal aliasing, so as to avoid modal aliasing, Improve the signal-to-noise ratio and avoid the effect of parameter setting

Inactive Publication Date: 2018-01-09
TIANJIN UNIV
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Problems solved by technology

[0003] The traditional median and average filtering methods are simple but not effective. Gabor filtering and wavelet threshold denoising methods filter out interference noise by manually setting thresholds, which are not adaptive and cannot obtain accurate phase information; The empirical mode decomposition process is completely based on the characteristics of the signal itself, and there is no need to artificially select the basis function, so it is widely used, but this method also has some shortcomings, such as: mode mixing, lack of theoretical support, etc., and cannot effectively deal with noise

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  • DSPI phase filtering method based on variable mode decomposition
  • DSPI phase filtering method based on variable mode decomposition
  • DSPI phase filtering method based on variable mode decomposition

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Embodiment 1

[0036] A DSPI phase filtering method based on variational mode decomposition, see figure 1 , the DSPI phase filtering method comprises the following steps:

[0037] 101: Perform variational modal decomposition on the collected DSPI phase diagram to obtain a series of modal function components, namely frequency and amplitude modulation components;

[0038] 102: Calculate the mutual information value between the FM component and the original speckle phase image, extract the principal component containing the measurement information according to the mutual information value, remove the noise component, and reconstruct the principal component;

[0039] 103: Calculate the sine and cosine diagrams of the reconstructed principal components respectively, and smooth the sine and cosine diagrams by means of an average method;

[0040] 104: Process the smoothed sine-cosine image by using an arctangent method to obtain a filtered speckle phase image.

[0041] Wherein, in step 101, the s...

Embodiment 2

[0054] The following is combined with specific calculation formulas, examples, Figure 2-Figure 5 The scheme in Example 1 is further introduced, see the following description for details:

[0055] 201: Combine figure 2 Build a digital speckle interferometry system, and use the CCD camera in the system to collect the DSPI phase images of the measured disc before and after deformation;

[0056] The detailed operation of this step is:

[0057] Build a digital speckle interferometry system, which is composed of CCD camera, imaging lens, laser, etc.;

[0058] Among them, the optical path of the measurement system is as follows: figure 2 As shown, the laser light emitted by the laser is divided into two beams of light by the beam splitter. One beam of light illuminates the surface of the measured object, and the other beam of light is transmitted along the optical fiber through the coupling lens as the object light. , Imaging lens, form speckle interference with the object light...

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Abstract

The invention discloses a DSPI (Digital Speckle Pattern Interferometry) phase filtering method based on variable mode decomposition. The DSPI phase filtering method comprises the following steps: performing variable mode decomposition on a digital speckle phase pattern to obtain a series of mode function components, namely frequency modulation and amplitude modulation components; calculating a mutual information value between the frequency modulation and amplitude modulation components and an original speckle phase pattern, extracting a principal component including measurement information according to the mutual information value, and reconstructing the principal component; respectively calculating a sine diagram and a cosine diagram of thereconstructedprincipal component, and smoothing the sine diagram and the cosine diagram by adopting a mean method; and processing the smoothed sine diagram and cosine diagram by using an arc tangent method to obtain a filtered speckle phase pattern.The method avoids a mode aliasingphenomenon in the EMD (Empirical Mode Decomposition) process on the premise that the speckle phase pattern comprises a lot of noise; and a picture is filtered by adopting the variable mode decomposition method to remove noise interference, so that accurate phase measurement information is acquired.

Description

technical field [0001] The invention relates to the fields of laser non-destructive testing and optical image processing, in particular to a DSPI phase filtering method based on variational mode decomposition. Background technique [0002] Digital Speckle Pattern Interferometry (Digital Speckle Pattern Interferometry, DSPI) is a full-field light measurement technology. , vibration measurement and deformation measurement and other fields have been widely used. Due to a large amount of noise interference in the collected speckle phase image, the signal-to-noise ratio of the speckle phase image is low, and the sensitivity of phase measurement is low, so it is impossible to obtain accurate information of the measured object. Therefore, it is necessary to process the speckle phase image to improve the signal-to-noise ratio of the image and remove noise interference. [0003] The traditional median and average filtering methods are simple but not effective. Gabor filtering and w...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T5/00G06T5/20G01B11/16
Inventor 肖启阳李健曾周末吴思进
Owner TIANJIN UNIV
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