Device for improving test ability of power capacitor

Abstract

The invention discloses a device for improving the test ability of a power capacitor. The device comprises a base; a conveying groove is formed in the middle of the upper end of the base; multiple conveying rollers are arranged in the conveying groove and are rotationally connected onto the inner wall of the conveying groove through rotating shafts; a device cavity is formed in the base; worms arearranged at the upper end of the base, penetrate through the side wall of the base and extend into the device cavity; one end of each worm is rotationally connected onto the inner wall of the devicecavity; a rotating wheel is arranged at the other end of each worm; worm gears are arranged in the device cavity; one end of each worm gear is rotationally connected onto the side wall of the device cavity; a cylinder is arranged at the end, far away from the inner wall of the device cavity, of each worm gear; and a strip-shaped groove is formed in the inner wall of the conveying groove. The device is reasonable in structural design and easy to operate, the labor intensity of a worker is effectively reduced, the working efficiency is improved, and meanwhile, the test ability of the power capacitor is improved.

Description

technical field [0001] The invention relates to the technical field of capacitor testing, in particular to a device for improving the experimental capability of power capacitors. Background technique [0002] At present, the power capacitor test device is to perform electrical performance withstand voltage test and dielectric loss test on a single capacitor. The whole process is as follows: [0003] 1 The product is on the track and reaches the test area; [0004] 2 Connect the upper electrode of the capacitor with a cable, and conduct a withstand voltage test and a dielectric loss test on the capacitor through the test system; [0005] 3 The product leaves the test area and arrives at the next process paint line; [0006] The disadvantages of the above-mentioned test device are as follows: [0007] 1 Only a single power capacitor can be tested; [0008] 2 The contact resistance between the upper electrode of the capacitor and the cable clamp is too large, and the temper...

AI Technical Summary

Problems solved by technology

[0007] 1 Only a single power capacitor can be tested;

[0008] 2 The contact resistance between the upper electrode of the capacitor and the cable clamp is too large, and the temperature is too high. When measuring the withstand voltage and dielectric loss of the capacitor, the product measurement is inaccurate, and the unqualified product flows into the next process, causing the product to appear during operation. electrical failure or accident;

[0009] 3 The operator is inconvenient to operate, the test ability cannot be improved, and the operator often enters and exits the

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