LET value variable adaptive fitting method for system function interruption cross section
A system function and cross-section fitting technology, applied in the field of system single-particle soft error protection evaluation, can solve problems such as the inability to establish analysis models, and achieve the effects of optimizing the single-particle test process, improving evaluation efficiency, and saving costs.
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[0045] Usually, the core components of the aerospace system, the internal sensitive components of which are exposed to single-event radiation, cause soft errors. Through the propagation coupling between the system functional modules, the output errors of key data signals that can be manifested as functions at the system level will eventually lead to system function failures. Panic, this error condition is usually interpreted as a functional interruption. This method is based on the digital signal processing system constructed by the SRAM type FPGA device, and the design resources associated with the configuration storage area and the internal sequential logic circuit are the single event effect sensitive components, and the LET-system function interruption cross section based on the system function interruption frequency function is established. Adapt to the change model to obtain the relationship between the LET value within the saturated LET threshold and the system function ...
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