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Shortest path feature set for representing distribution of electric fields of sphere gaps

A technology of the shortest path and electric field distribution, applied in the direction of electrical digital data processing, special data processing applications, instruments, etc., can solve the problems of restricting the application of breakdown voltage prediction methods, irregular electrode structures, and difficult definition of spatial regions, etc., to achieve easy Acquisition, extraction process simplification, more effective effect

Active Publication Date: 2018-05-18
WUHAN UNIV
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Problems solved by technology

However, for complex engineering gap structures, such as the transmission line-tower air gap, the electrode structure is extremely irregular, and it is difficult to define spatial regions such as "the entire area, the discharge channel, and the electrode surface", which leads to limited generalization of this set of electric field feature sets. Application of Breakdown Voltage Prediction Method

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  • Shortest path feature set for representing distribution of electric fields of sphere gaps
  • Shortest path feature set for representing distribution of electric fields of sphere gaps
  • Shortest path feature set for representing distribution of electric fields of sphere gaps

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Embodiment Construction

[0031] Embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings.

[0032] This embodiment adopts the following technical scheme to realize, a shortest path feature set used to characterize the electric field distribution of the ball gap, the three-dimensional electric field distribution of the ball gap is obtained through electrostatic field simulation calculation, and the path where the shortest geometric distance between two ball electrodes is located Defined as the shortest path, select n sampling points equidistantly on the shortest path, extract the original data such as coordinates and electric field strength of n sampling points, draw the electric field distribution curve of the shortest path, and take the sampling point where the minimum value of electric field strength is located as the critical point , the electric field distribution curve is divided into high-voltage section and low-voltage section, and the ...

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Abstract

The invention relates to high-voltage and insulation technologies, in particular to a shortest path feature set for representing distribution of electric fields of sphere gaps. The distribution of thethree-dimensional electric fields of the sphere gaps are acquired by means of static electric field simulation computation, paths where the shortest geometric distances between every two sphere electrodes are located are defined as the shortest paths, n sampling points are equidistantly selected on the shortest paths, original data of coordinates, electric field intensity and the like of the n sampling points are extracted, electric field distribution curves of the shortest paths are plotted, the sampling points with the minimum values of the electric field intensity are used as critical points, the electric field distribution curves are divided into high-voltage sections and low-voltage sections, electric field feature quantities are defined at the high-voltage sections and the low-voltage sections, and the shortest path feature set for representing the distribution of the electric fields of the sphere gaps can be acquired according to the extracted original data and feature quantitycomputational formulas. The shortest path feature set comprises electric field intensity, electric field gradient, electric field square, electric field intensity integration, path length and electric field unevenness feature quantities. The shortest path feature set has the advantages that extraction procedures are simple, and the distribution of the electric fields of the sphere gaps can be perfectly represented by the shortest path feature set.

Description

technical field [0001] The invention belongs to the technical field of high voltage and insulation, and in particular relates to a feature set of the shortest path used to characterize the electric field distribution of a ball gap. Background technique [0002] Dielectric strength prediction is one of the shortcomings of the intelligent design and manufacture of high-voltage electrical equipment. Due to the imperfect discharge theory of various dielectrics and the lack of a clear control equation for the discharge process, it is still difficult to realize the discharge voltage calculation of different gap structures. For a certain gap structure, under a specific loading voltage and dielectric properties, the randomness of the discharge process is strong, but the dispersion of the discharge voltage can be controlled within a certain range, so it can be considered that its insulation strength depends on the gap structure, If the correlation between dielectric strength and gap ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/50
CPCG06F30/23G06F2111/10Y02E60/00
Inventor 邱志斌阮江军金颀王学宗
Owner WUHAN UNIV
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