Technology to eliminate interference clutters of self-corrected supersonic thickness measuring system

An ultrasonic and self-calibration technology, which is applied in the direction of using ultrasonic/sonic/infrasonic waves, measuring devices, instruments, etc., can solve the problems affecting the system's signal identification and interference, eliminate the influence of clutter on the measurement, and improve the detection accuracy. Effect

Inactive Publication Date: 2018-05-25
SICHUAN UNIV
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  • Abstract
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  • Claims
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Problems solved by technology

[0009] However, in the ultrasonic beams excited by the ultrasonic probe, only a part of the beams is vertically transmitted into the correction block, and the propagation direction of some beams has a certain angle with the vertical direction. After this part of the ultrasonic wave enters the correction block obliquely, it will Specular reflection occurs on the circumferential surface and bottom surface of the calibration block, and is finally received by the ultrasonic probe to form clutter interference signals
Moreover, the amplitude of this part of the clutter interference signal is equivalent to the amplitude of the reflected signal on the bottom surface of the DUT, which can easily affect the system's identification of the signal

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  • Technology to eliminate interference clutters of self-corrected supersonic thickness measuring system
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  • Technology to eliminate interference clutters of self-corrected supersonic thickness measuring system

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Embodiment Construction

[0021] An embodiment of the invention is described in detail as follows:

[0022] The present invention is an ultrasonic thickness measurement technology with self-correcting function, and the specific implementation steps are as follows:

[0023] (1) Select a metal plate with a thickness of 10mm as the object to be tested, and the material of the metal plate is No. 20 carbon steel. A correction block is processed by using No. 20 carbon steel. The shape of the correction block is cylindrical, the diameter is 10mm, and the thickness is 25mm. A thread with a pitch of 1mm is processed on the circumference of the correction block.

[0024] (2) Fix the ultrasonic probe on the upper surface of the calibration block, the ultrasonic wave generated by the ultrasonic probe has a wavelength of 1.2mm.

[0025] (3) Apply couplant on the lower surface of the calibration block to measure the thickness of the metal plate.

[0026] (4) Use the heater to heat the tested metal plate to change ...

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Abstract

The invention relates to a technology to eliminate interference clutters of a self-corrected supersonic thickness measuring system. Part of supersonic waves emitted by a traditional self-corrected supersonic thickness measuring system is not vertical in wave velocity, is reflected regularly by a cylindrical wall and lower surface of a correction block after entering the correction block, is finally received by a supersonic probe, and forms interference signals of very high amplitude. Threads whose pitch is lower than the wavelength of supersonic waves is processed on the correction block, thesupersonic waves entering the correction block in an inclined way are reflected in a diffuse way on the cylindrical wall, so that the amplitude of clutter signals received by the supersonic probe is reduced greatly, and the clutter signals can be distinguished from measured signals very easily.

Description

technical field [0001] The invention is mainly used for improving the detection accuracy of the self-correcting ultrasonic thickness measuring system. Background technique [0002] At present, the petrochemical industry and construction industry all need to measure the thickness of metal pipes and large steel frame structures. Ultrasonic thickness measurement technology is a technology widely used in the above industries. Its working principle is as follows: [0003] Put the ultrasonic probe in close contact with the tested part, apply a coupling agent between the probe and the tested part, part of the ultrasonic waves excited by the ultrasonic probe will be reflected on the upper surface of the tested part, and the other part of the ultrasonic waves will be transmitted and enter the tested part When the ultrasonic wave encounters the bottom surface of the tested part, part of the ultrasonic wave will be reflected back and received by the ultrasonic probe. The ultrasonic pro...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B17/02
CPCG01B17/02
Inventor 甘芳吉王少纯廖俊必
Owner SICHUAN UNIV
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