Test device and test system
A test device and test system technology, applied in the direction of measuring devices, measuring electrical variables, instruments, etc., can solve problems such as low efficiency, achieve the effects of reducing floor space, shortening test time, and improving test efficiency
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[0037] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0038] According to the background technology, in the test part of the LEU cable detection box, the connecting cables (the length of the cable is between 200m and 4500m) need to be connected for a certain distance during the test, which takes up a lot of space, and is heavy and inconvenient to transfer. In some places where testing is required, and in some test environments there is a large demand for labor, how to quickly detect the test results of the LEU cab...
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