Atomic gas chamber surface stress test device and test method

Abstract

The invention belongs to the technical field of gas chamber surface stress test, and specifically discloses an atomic gas chamber surface stress test device and test method. The device comprises a laser collimator, a polarizer, an atomic gas chamber, a 1 / 4 wave plate, a polarization analyzer and a CCD and lens. The device further comprises a fixed mounting base, an optical adjustment frame and four support rods. The method comprises the following steps: after a light source passes through the laser collimator and the polarizer, two beams of linearly polarized light are formed; a phase difference of PI / 2 is produced between the two beams of light; the zero position of the polarization analyzer is recorded; a gas chamber stress distribution picture with gray values is recorded by the CCD; and the correspondence between the gray values of the positions of the gas chamber and the rotation angle of the polarization analyzer is obtained, the angle of the polarization analyzer corresponding to the point with the minimum gray value at each position is obtained through fitting, and finally, the stress value distribution of the gas chamber is obtained. Precision error caused by direct measurement is eliminated, and the precision is improved. The atomic gas chamber surface stress test device adopts a cage structure, which facilitates light path alignment. Moreover, the device has a simpleand compact structure, and is stable and reliable.

Description

technical field [0001] The invention belongs to the technical field of gas chamber surface stress testing, and in particular relates to a device and method for accurately measuring gas chamber surface stress. Background technique [0002] Due to the particularity of the production process of cell glass, there will inevitably be stress on the glass surface after production, which can generally be divided into three types: thermal stress, structural stress and mechanical stress. Thermal stress is the interaction force caused by the temperature difference, which is mainly affected by the temperature difference, and can be eliminated by annealing and reducing the temperature difference; structural stress is the interaction force caused by the inherent structure of the gas chamber, which is determined by the material It is determined by itself; mechanical stress is the internal interaction force when the glass is subjected to external force, and the stress disappears after the ex...

AI Technical Summary

Problems solved by technology

The interference color method has a simple structure and can only be used for quantitative evaluation; the penumbral analyzer method has a complex structure and has high requirements for polarizing devices; the quarter-wave plate method is limited by the low sensitivity of the human eye to light brightness Atomic gas chamber stress test accuracy is low

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