Device for processing silicon ring and processing method
A silicon ring and driving device technology, applied in the field of silicon ring processing devices, can solve problems such as low efficiency, silicon wafer contamination, and affecting product yield, and achieve high efficiency and reduce the processing time of the inner circle.
Inactive Publication Date: 2018-06-29
GRINM SEMICONDUCTOR MATERIALS CO LTD
View PDF5 Cites 1 Cited by
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
[0003] When the silicon wafer is etched by plasma, the silicon part carrying the silicon wafer will also be etched by the plasma. If there are damages and burrs on the edge of the silicon part, silicon slag will fall off due to bumping, and the silicon wafer to be etched Causes contamination and affects the yield of the final product, so the edges of silicon components are generally required to be chamfered
Method used
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View moreImage
Smart Image Click on the blue labels to locate them in the text.
Smart ImageViewing Examples
Examples
Experimental program
Comparison scheme
Effect test
Embodiment
[0023] Using the device and processing method of the present invention, the inner circle of the silicon ring is chamfered, and after chamfering, the scale amplifier is used to measure. In the chamfering process, 500 mesh silicon carbide sand is used, the speed of the chamfering disk is 50 rpm, and the chamfering time is 1 minute.
[0024]
[0025] It can be seen from the results that using the device of the present invention, the inner circle of the silicon ring can be chamfered, and the chamfering time can be determined to obtain high-quality silicon ring products.
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More PUM
Login to View More Abstract
The invention discloses a device for processing a silicon ring and a processing method. The device comprises a chamfering disc and a driving device, wherein the chamfering disc rotates under the driving of the driving device. The method for processing a silicon ring by adopting the device comprises the steps of (1) installing the chamfering disc on a rotating device, and coating the chamfering disc with grinding mortar; (2) chamfering an inner circle of the silicon ring, and adjusting the edge shape of the inner circle through adjusting the autorotation speed and grinding time of the chamfering disc; and (3) cleaning the silicon ring. Chamfering is performing on the inner circle of the silicon ring according to the device and processing method disclosed by the invention, thereby being simple to implement and high in efficiency, and greatly reducing the processing time of the inner circle.
Description
Technical field [0001] The invention relates to a device and a processing method for processing silicon rings. Background technique [0002] Generally, when manufacturing semiconductor integrated circuits, the interlayer insulating layer (SiO 2 ) Perform an etching process. In order to etch the silicon wafer with the insulating layer, a plasma etching device is used. In this plasma etching apparatus, the etching gas is directed to the silicon wafer through the through-holes provided in the silicon electrode plate while applying a high-frequency voltage to generate plasma between the silicon electrode plate for plasma etching and the silicon wafer. , The plasma acts on the silicon wafer to etch the insulating layer on the surface of the silicon wafer. In this process, the silicon wafer is placed on the stage. Due to the difference in technology or silicon wafer size, the structure of the slide table is also different, collectively referred to as the silicon ring. [0003] During...
Claims
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More Application Information
Patent Timeline
Login to View More Patent Type & Authority Applications(China)
IPC IPC(8): H01L21/304H01L21/02
CPCH01L21/02021H01L21/02087H01L21/304
Inventor 库黎明白鸽玲白杜娟朱秦发夏青闫志瑞李磊
Owner GRINM SEMICONDUCTOR MATERIALS CO LTD

