Circuit level single event effect simulation platform

A simulation platform and circuit technology, applied in design optimization/simulation, CAD circuit design, electrical digital data processing, etc., can solve problems such as the fault current source simulation platform that has not yet been seen, and achieve the effect of fast simulation speed and low cost

Active Publication Date: 2018-08-03
陕西欣微绘通科技有限公司
View PDF8 Cites 23 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] At present, there is no simulation platform that can simultaneously inject multiple fault current sources for large-scale circuits

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Circuit level single event effect simulation platform
  • Circuit level single event effect simulation platform
  • Circuit level single event effect simulation platform

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0037] Each module of the circuit-level single event effect simulation platform of the present invention will be further described in detail below in conjunction with the accompanying drawings.

[0038] Such as figure 1 , figure 2 As shown, the circuit-level single event effect simulation platform includes a circuit analysis module, a fault injection configuration module, an analysis mode module, a netlist processing module and a result analysis module.

[0039] The circuit analysis module obtains the ratio of the node list file of the analyzed circuit to the drain region in the layout. Specifically: the circuit analysis module uses Perl script and C-shell script to extract all nodes in the circuit according to the netlist file of the circuit, and stores all nodes in a circuit node list file. For different circuit forms, such as SRAM circuit and CPU circuit, the scripts for extracting circuit nodes will be different, but they will all form a circuit node list file, and each...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention provides a circuit level single event effect simulation platform. The simulation platform can support single event effect simulation analysis of large-scale circuits of 10,000 gate levels or above. The simulation platform comprises a circuit analysis module, a fault injection configuration module, an analysis mode module, a netlist processing module and a result analysis module, wherein the circuit analysis module extracts all sensitive nodes in circuits to generate a circuit node list file; the fault injection configuration module combines the circuit node list file and fault current source-related parameters which are input by a user and need to be injected into the circuits to write a script and randomly select circuit nodes and fault injection time to generate a fault injection file; the netlist processing module writes a script to obtain a result detection file, and combines analysis modes and the fault injection file to generate a stimulus file to be sent to a Fast-Spice simulator; the result analysis module saves and extracts simulation results, and forms different result icons according to different analysis modes.

Description

technical field [0001] The invention belongs to the field of space radiation effects, and relates to a single event effect simulation platform, which is especially suitable for relevant researchers to conduct single event effect simulation analysis on large-scale circuits of more than 10,000 gates. Background technique [0002] With the further development of aerospace industry and nuclear energy technology, both national defense modernization and national economic construction are in urgent need of electronic components with high reliability and high performance. Single event effect (SEE) refers to a radiation effect in which a single high-energy particle in the universe is injected into the sensitive area of ​​a semiconductor device, causing the logic state of the device to flip. This will lead to system dysfunction and, in severe cases, catastrophic accidents. With the improvement of process technology and the reduction of transistor size, the single event effect has bec...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/50
CPCG06F30/20G06F30/30
Inventor 吴汉鹏李建波徐长卿刘毅杨银堂
Owner 陕西欣微绘通科技有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap