Temperature control and pressure control sample stage and temperature and pressure control system

Abstract

The invention provides a temperature control pressure control sample stage and a temperature and pressure control system. The temperature control and pressure control sample stage in the temperature and pressure control system comprises a pressure cover, a heat conductor and a microscope stage, a sample groove is arranged on the top of the heat conductor, a temperature sensor and a heating resistor are distributed at the bottom of the sample groove from top to bottom, a pipeline for conveying a cold medium is arranged in the heat conductor, the pipeline is arranged around the sample groove, and the pressure cover is buckled on the sample groove to provide a high pressure for the sample groove. The temperature control system includes a cold source, a high-pressure spring hose connected to the pressure cover, and a controller, two ends of the pipeline are respectively connected with a cold source and a cold medium pump, and the controller is connected with the temperature sensor, the cold medium pump and the heating resistor; and one end of the high-pressure spring hose is divided into four branches, one of the branches is connected with a vacuum pump for pumping out a gas in the pressure cover, one of the branches is connected with a high-pressure gas source for injecting a gas into the pressure cover, one of the branches is connected to with a stop valve, and the remaining oneis connected with a back pressure valve for making the gas pressure of the pressure cover smaller than a preset value for the back pressure valve.

Description

technical field [0001] The invention relates to the technical field of testing the properties of materials such as non-conductors, organic solids, polymers, and biomacromolecules, such as electricity, magnetism, and mechanics, and in particular to a temperature and pressure control sample platform and a temperature and pressure control system. Background technique [0002] Scanning probe microscopy techniques such as atomic force microscopy are widely used in the testing of the morphology, electrical, magnetic and mechanical properties of non-conductors, organic solids, polymers and biomacromolecules. Common atomic force microscopes can only test samples that are stable at normal temperature and pressure, but cannot test samples that are unstable at normal temperature and pressure. For example, gas hydrate samples are synthesized and stabilized under low temperature and high pressure conditions, and the stability of the samples can only be maintained at extremely low tempera...

AI Technical Summary

Problems solved by technology

[0003] At this stage, the sample stage of low-temperature atomic force microscope often adopts semiconductor refrigeration. The lower limit of this method is about minus 30 degrees Celsius, which cannot meet the tempe

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