Sensor applied to scanning probe microscope
A technology for scanning probes and sensors, applied in the field of scanning probe microscopes, which can solve problems such as sensor vibration, and achieve the effects of high quality factor, improved resolution and application range, and simple structure
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[0020] In order to make the purposes, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments These are some embodiments of the present invention, but not all of them. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.
[0021] combine figure 1 and figure 2 , in one embodiment, the present invention is applied to a sensor of a scanning probe microscope, comprising: a base 1, an insulating carrier layer 2 located on the upper side of the base 1, a first quartz crystal oscillator 3 located on the insulating carrier layer 2, a second quartz crystal The ...
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