Micro-amount liquid reflective rate measuring device and measuring method based on self-mixing interference
A self-mixing interference and measurement device technology, applied in the field of optical measurement, can solve the problems of large demand for liquid to be measured and cannot realize micro-measurement, measuring equipment and instruments require engraving, difficult to measure precious and scarce samples, etc., and achieve easy industrial application , The measurement method is simple and the effect of low requirements
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Embodiment 1
[0044] see figure 2 , The invention discloses a refractive index measurement device based on self-mixing interference, which includes an optical path part and a signal processing part. The optical path part includes a laser light source 11, a phase adjuster 12, an optical path refraction unit 13, and an object-carrying platform 14; the object-carrying platform 14 is used to load the sample to be measured; The sample to be tested is connected with the optical axis in sequence. The signal processing part includes a signal preprocessing circuit 21 , an A / D conversion circuit 22 , a DSP data processing unit 23 and an output terminal 24 . The input end of the signal preprocessing circuit 21 is connected to the laser light source 11, and the signal preprocessing circuit 21, the A / D conversion circuit 22, the DSP data processing unit 23 and the output terminal 24 are circuit connected in sequence.
[0045]In this embodiment, the laser light source 11 is a semiconductor laser, on w...
Embodiment 2
[0049] Cooperate figure 2 and image 3 As shown, the present invention discloses a method for measuring refractive index based on self-mixing interference. The method uses the device for measuring refractive index based on self-mixing interference in Embodiment 1, and is specifically implemented through the following steps:
[0050] S1. Place the standard sheet on the stage, turn on the laser light source, adjust the loading platform, make the laser irradiate on the standard sheet, and ensure that the reflected laser light can pass back to the laser light source;
[0051] S2, start the phase regulator, input the reference value R of the standard film 1 , the DSP data processing unit calculates the light feedback intensity C at this time 1 (Adopt waveform fitting method, characteristic point analysis method or spectrum analysis method, adopt waveform fitting method in the present embodiment), store C 1 and R 1 ;
[0052] S3. Adjust the thickness and area of the cell cav...
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