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Electronic test comprehensive instrument and operation method thereof

A technology for electronic testing and resistance testing, applied in multi-tester circuits, etc., can solve the problems of no combination expansion function, user inconvenience, single function, etc., to achieve the effect of convenient and rapid connection, easy portability, and wide application range.

Inactive Publication Date: 2018-11-16
上海澄科电子科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] Existing general-purpose electronic measuring instruments are mainly discrete instruments with single functions, no embedded operating system, and no combined expansion functions, such as signal generators, oscilloscopes, logic analyzers, spectrum analyzers, frequency meters, and digital integrated circuit testers , LCR meter, multimeter, etc., only one specific function
However, in actual field applications, two or more instruments with different functions are often used at the same time. Users need to carry a variety of instruments when they work. Many instruments, large volume, and relatively heavy, all bring inconvenience to users

Method used

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  • Electronic test comprehensive instrument and operation method thereof
  • Electronic test comprehensive instrument and operation method thereof
  • Electronic test comprehensive instrument and operation method thereof

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Effect test

Embodiment 1

[0043] The invention discloses a comprehensive electronic test instrument, the composition and connection schematic diagram of which is attached figure 1 Shown: a housing with a rectangular parallelepiped structure, and an oscilloscope interface and a signal source interface arranged on one side wall of the housing, and the other symmetrical side wall is provided with a USB data communication interface, a USB indicator light, a configuration switch key, A multimeter voltage / resistance test port, a multimeter common terminal test port, a multimeter current test port, a power indicator light and a USB power supply port, a row of cooling holes are respectively arranged on the upper and lower wall ridges of the other two side walls of the housing, and the housing The upper surface of the body is provided with two sets of pin headers, and the housing is provided with an MCU controller and a power supply module, as well as an A / D sampling module connected to the oscilloscope interfac...

Embodiment 2

[0052] This embodiment relates to a comprehensive electronic testing instrument, and its composition and connection schematic diagram is the same as that of Embodiment 1.

[0053] This embodiment provides a method for operating a comprehensive electronic test instrument. The schematic diagram of its operating mode and principle modules is shown in the attached figure 2 , 3 , 4, 5 and 6, including the following steps:

[0054] Step 1, the USB power supply interface is connected to a power supply, the configuration key is turned on, and the oscilloscope interface, the signal source interface, the multimeter voltage / resistance test port, the multimeter common terminal test port, the multimeter current test port or the pin header are selected to connect to the test equipment;

[0055] Step 2, enter the exclusive interface of each mode on the computer side and click to select the required operation mode, and transmit the operation command to the MCU controller through the USB dat...

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Abstract

The invention provides an electronic test comprehensive instrument, which comprises a casing with a cuboid structure, and oscilloscope interfaces and signal source interfaces which are disposed on oneside wall of the casing. A USB data communication interface, a USB indication lamp, a configuration switch button, a multimeter voltage / resistance test port, a multimeter common test port, a multimeter current test port, a power indication lamp and a USB power supply interface are arranged in sequence on the other symmetrical side wall. The upper surface of the casing is provided with two sets ofpin headers, and the casing is provided with a MCU controller, a power module, A / D sampling modules, and DA converters. The invention also provides an electronic test comprehensive instrument and anoperation method thereof. The invention realizes the functions of an oscilloscope, a signal generator, a power source, an amplitude frequency characteristic analyzer, a spectrum analyzer, and a multimeter, can simultaneously use multiple function modes, and not only has full functions, but can further develop a new functional module. The instrument is small, lightweight and portable, and is a newpocket instrument.

Description

technical field [0001] The invention relates to the technical field of electronic testing, in particular to an electronic testing comprehensive instrument and an operating method thereof. Background technique [0002] Existing general-purpose electronic measuring instruments are mainly discrete instruments, with single functions, no embedded operating system, and no combined expansion functions, such as signal generators, oscilloscopes, logic analyzers, spectrum analyzers, frequency meters, and digital integrated circuit testers. , LCR meter, multimeter, etc., only one specific function. However, in actual on-site applications, two or more instruments with different functions are often used at the same time. Users need to carry multiple instruments during work. There are many instruments, large volume, and relatively heavy, which bring inconvenience to users. Therefore, it is imperative to develop a small and portable electronic test comprehensive instrument that integrates...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R15/12
CPCG01R15/12
Inventor 胡宗敏
Owner 上海澄科电子科技有限公司
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