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Debugging instrument, debugging platform and debugging method based on debugging instrument

A debugging method and technology of debugging instruments, which are applied in the parts, instruments, multi-tester circuits of electrical measuring instruments, etc., can solve problems such as asset backlog, accelerate debugging and testing speed, avoid misoperation, and avoid multiple dismantling. the effect of

Inactive Publication Date: 2018-11-20
SICHUAN JIUZHOU ELECTRIC GROUP
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  • Summary
  • Abstract
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  • Claims
  • Application Information

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Problems solved by technology

[0008] Asset backlog when commissioning using existing commissioning techniques

Method used

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  • Debugging instrument, debugging platform and debugging method based on debugging instrument
  • Debugging instrument, debugging platform and debugging method based on debugging instrument
  • Debugging instrument, debugging platform and debugging method based on debugging instrument

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0063] A debugger, comprising:

[0064] Simulate the environment of the whole machine to provide the module under test with a processing board for encoding signals, debugging signals, control signals and RF input signals according to the working mode of the module under test;

[0065] Oscillation source, excitation source, synthetic power amplifier module for step-by-step signal amplification of the RF signal provided by the processing board;

[0066]It is used for connecting cables for oscillation source, excitation source, synthetic power amplifier module, tested component debugging and signal output cable for radio frequency signal output. The signal output cable can be connected copper cable.

[0067] During debugging, the debugger 1 connects the debugging component and the processing board respectively through connecting cables, and completes debugging with other components of the debugging platform. like figure 1 As shown, the components of the debugging platform also ...

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Abstract

The invention discloses a debugging instrument, a debugging platform and a debugging method based on the debugging instrument. The debugging instrument comprises the components of a processing board which simulates a whole machine environment and supplies a coding signal, a debugging signal, a control signal and an RF input signal to a tested module according to the working mode of a tested module; an oscillating source, an excitation source and a synthetic power amplifier module which performs stepwise signal amplification on the RF signal which is supplied by the processing board; a connecting cable which is used for performing debugging on the oscillating source, the excitation source, the synthetic power amplifier module and the tested module; and a signal output cable for outputting the RF signal. The signal output cable can be a connecting copper cable. A plurality of signals are supplied according to the working mode of the tested module, thereby finishing debugging and testingof a plurality of modules, preventing multiple times of detachment of the whole machine, and greatly improving debugging speed and testing speed.

Description

technical field [0001] The invention relates to the technical field of product debugging, in particular to a debugging instrument, a debugging platform and a debugging method based on the debugging instrument. Background technique [0002] With the development and progress of modern electronic technology, the miniaturization and modularization of equipment is an inevitable trend in the development of electronic equipment in the future. To adapt to the development of society, modularization of various functions has become a mainstream design solution. The modular design scheme facilitates the rapid location of fault points, brings convenience in maintenance, and greatly improves the efficiency of troubleshooting. [0003] However, testing various single modules has become a difficult problem, such as the need to use the whole machine for inspection, poor contact during testing, easy to make mistakes, many external cross-linking signals, complex testing methods, and no effecti...

Claims

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Application Information

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IPC IPC(8): G01R1/28G01R15/12G01R31/00
CPCG01R1/28G01R15/12G01R31/00
Inventor 申涛冷晓江薛飞
Owner SICHUAN JIUZHOU ELECTRIC GROUP
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