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Heteroepitaxial film structure

A technology of epitaxial thin film and thin film, which is applied in the direction of chemically reactive gas, single crystal growth, polycrystalline material growth, etc., can solve the problems of unobtainable, large difference in crystal structure, control of film growth quality and orientation, etc., and achieve a wide range of The effect of use

Inactive Publication Date: 2018-11-30
TIANJIN POLYTECHNIC UNIV
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Problems solved by technology

However, due to the crystal structure of the GaN substrate and the cubic pyrochlore structure Bi with dielectrically tunable properties 1.5 ZnNb 1.5 o 7 or Bi 1.5 MgNb 1.5 o 7 The crystal structure of the material is quite different, and the existing technology is mainly to obtain the polycrystalline structure of Bi 1.5 ZnNb 1.5 o 7 or Bi 1.5 MgNb 1.5 o 7 film, and the quality and orientation of film growth are controlled by process conditions, and the cubic pyrochlore structure Bi on the GaN substrate cannot be obtained 1.5 ZnNb 1.5 o 7 or Bi 1.5 MgNb 1.5 o 7 Epitaxial film

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Embodiment Construction

[0016] The invention discloses a heterogeneous epitaxial thin film structure. The epitaxial thin film structure comprises: a substrate, the substrate is a gallium nitride substrate with an epitaxial growth surface; an epitaxial layer, the epitaxial layer has a dielectric adjustable Properties of oxide thin films, further specifically bismuth zinc niobate Bi with cubic pyrochlore structure 1.5 ZnNb 1.5 o 7 or bismuth magnesium niobate Bi 1.5 MgNb 1.5 o 7 thin film, the thin film is grown on the epitaxial growth surface of the substrate; and a buffer layer, the buffer layer is arranged between the substrate and the epitaxial layer, the buffer layer is composed of two layers of oxide films, two layers of oxide Thin films are ZnO and TiO 2 thin film and TiO 2 The thin film is next to the gallium nitride substrate, and the ZnO thin film is next to the epitaxial layer. The specific implementation manner of the present invention will be described below in conjunction with the ...

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Abstract

The invention relates to an epitaxial film structure. The epitaxial film structure comprises a substrate, an epitaxial layer and a buffer layer, wherein the substrate is a gallium nitride substrate having an epitaxial growth surface; the epitaxial layer is an oxide film having dielectric tunability, and the film grows on the epitaxial growth surface of the substrate; the buffer layer is arranged between the substrate and the epitaxial layer; the buffer layer is formed by two layers of oxide films.

Description

technical field [0001] The invention relates to a heterogeneous epitaxial thin film structure, in particular to a dielectric adjustable thin film epitaxial thin film structure on a gallium nitride substrate. Background technique [0002] Bismuth-based cubic pyrochlore structure dielectric materials have broad application prospects in high-Q microwave voltage-controlled devices. At the same time, due to its high dielectric constant and low loss characteristics under microwave, it can also be used in the gate dielectric film of gallium nitride high electron mobility transistors, reducing the direct tunneling effect and the electric field strength of the gate dielectric layer. If it can be integrated with gallium nitride, it will promote the multi-functional integration and miniaturization of monolithic microwave integrated circuits, and improve system reliability. [0003] The existing technologies mainly include: (1) using physical film growth methods such as magnetron sputt...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): C30B29/16C30B25/18
CPCC30B25/183C30B29/16
Inventor 宁平凡牛萍娟刘宏伟张建新李玉强梁立君
Owner TIANJIN POLYTECHNIC UNIV