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Auxiliary assembly structure and construction method for collimating dmd lithography system

A technology of a lithography system and a construction method, applied in the field of optical experimental auxiliary structure equipment, can solve the problems affecting the lithography accuracy and quality, etc.

Inactive Publication Date: 2020-06-30
NORTHEAST NORMAL UNIVERSITY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This surface projection lithography technology has very high requirements on the linearity of the optical system, and requires the optical axis of the projection optical system to be strictly perpendicular to the plane where the DMD chip and the substrate to be processed are located, because it directly affects the accuracy and quality of lithography.

Method used

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  • Auxiliary assembly structure and construction method for collimating dmd lithography system
  • Auxiliary assembly structure and construction method for collimating dmd lithography system

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Embodiment Construction

[0028] In conjunction with the description of the accompanying drawings, the present invention is further described: the present invention proposes an auxiliary assembly and adjustment structure for a collimated DMD lithography system, which is characterized in that it includes a DMD spatial modulator 1, a 405nm continuous laser light source 2, a tube lens I3, semi-transparent mirror 4, tube lens II5, CCD camera 6, 45° mirror 7, projection objective lens 8, manual large-stroke three-dimensional translation stage 9, piezoelectric platform 10, adapter frame 11 and adjustable sample stage 12 ;

[0029] The DMD spatial modulator 1 is arranged on an optical platform through a DMD chip assembly frame;

[0030] The 405nm continuous laser light source 2 is fixed on the optical platform by a mechanical mount, and the 405nm continuous laser light source 2 is connected to the uniform light device through an optical fiber, and the straight line where the output end of the light uniform de...

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Abstract

An auxiliary mounting structure for collimating DMD lithography system and a construction method thereof, belonging to the field of optical experiment auxiliary structure equipment, in particular to an auxiliary mounting structure for a DMD lithographic projection system and a construction method thereof, comprises a DMD spatial modulator, a 405nm continuous laser light source, a tube lens I, a semi-transparent semi-reflective mirror, a tube lens II, a CCD camera, a 45-degree reflective mirror, a projection objective lens, a manual large-stroke three-dimensional displacement stage, a piezoelectric stage, an adapter and an adjustable sample stage; The invention provides an auxiliary mounting structure of a collimated DMD lithography system with high precision and convenient assembly and debugging, A DMD lithographic projection system is provide, in which that plane of the DMD chip is perpendicular to the optical axis of the optical system and the optical axis of the optical system is perpendicular to the plane of the substrate to be processed, so as to obtain an auxiliary mount structure and a construction method of the DMD lithographic projection system with optimum lithographic exposure accuracy and quality, and is suitable for popularization and implementation in various laboratories.

Description

technical field [0001] The invention belongs to the field of auxiliary structure equipment for optical experiments, and in particular relates to an auxiliary assembly and adjustment structure for a DMD lithography projection system and a construction method thereof. Background technique [0002] Since the 1960s, lithography technology has been supporting the realization and development of integrated circuits in the semiconductor industry, from the integration of dozens of devices on a single chip to the integration of more than one billion devices on a single chip. Although traditional lithography technology has played an irreplaceable role in the semiconductor chip preparation process, its expensive equipment, harsh environmental requirements and high access conditions limit its service to the majority of scientific researchers; in addition, with the characteristics of semiconductor chips The size is getting smaller and smaller, and the requirements for the manufacturing pr...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G03F7/20
CPCG03F7/70383G03F7/70833
Inventor 刘华张莹罗钧陆子凤
Owner NORTHEAST NORMAL UNIVERSITY