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A molecular marker linked to wheat head blight resistance qtl and its application

A wheat scab and molecular marker technology, applied in the fields of wheat genetics and breeding and molecular biology, to achieve the effects of ensuring accuracy, high amplification efficiency, and speeding up the breeding process

Active Publication Date: 2021-03-02
JIANGSU ACAD OF AGRI SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

At present, there is no report on the molecular markers linked to the QTL locus "QFHB.2BL" on the long arm of wheat 2B chromosome

Method used

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  • A molecular marker linked to wheat head blight resistance qtl and its application
  • A molecular marker linked to wheat head blight resistance qtl and its application
  • A molecular marker linked to wheat head blight resistance qtl and its application

Examples

Experimental program
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Effect test

Embodiment 1

[0031] Example 1 Verification of Molecular Marker JAAS52433R1 in Resistant and Sensitive Varieties

[0032] The DNA templates amplified by PCR in this example are: Ningmai No. 9, Ningmai No. 13, Wangshuibai and Sumai No. 3. The average severity of these wheat varieties is 2.25, 2.53, 0.96 and 1.33, respectively, which is the right Wheat varieties with moderate or above moderate resistance to mildew; Jimai 22, Annong 8455, Huaimai 18 and Xiaoyan 54 had an average disease spikelet rate of 8.41, 8.14, 7.44 and 7.94, respectively, which were susceptible varieties. The genomic DNA of wheat leaves was extracted by CTAB method, and the genomic DNA was quantified by micro-spectrophotometer Nanodrop.

[0033] When using the software Primer Premier5.0 to design molecular marker primers for variable sites, the primer design software cannot perform sequence comparison and correction, cannot anchor the variable sites, and cannot adjust the base types at the end of the primers. The primer ...

Embodiment 2

[0042] Example 2 Using molecular marker JAAS52433R1 to screen wheat materials resistant to head blight

[0043] The tested varieties (lines) are wheat varieties "Ningmai" series: Ningmai No. 3, Ningmai No. 6, Ningmai No. 7, Ningmai No. 8, Ningmai No. 9, Ningmai No. 10, Ningmai No. 11, Ningmai No. 12, Ningmai No. 13, Ningmai No. 14, Ningmai No. 15, Ningmai No. 16, Ningmai No. 18 and Ningmai No. 20 were bred by the Grain Crops Research Institute of Jiangsu Academy of Agricultural Sciences and are commercialized Wheat varieties; Wheat strains are: Ning 0076, Ning 0149, Ning 0311, Ning 0320, Ning 0331, Ning 05450, Ning 05-51, Ning 0588, Ning 06-174, Ning 0668, Ning 0670, Ning 07169, Ning 0798, Ning 07-F307, Ning 61799, Ning 7840, Ning 8940, Ning 894013, Ning 894037, Ning 9-11, Ning 9181 and Ning 9 78.

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Abstract

The invention discloses a molecular marker linked with wheat head blight resistance QTL and its application. The molecular marker is based on the DNA of wheat variety Sumai No. 3 as a template, and the nucleotide sequences are respectively as SEQ ID NO.1 and The primer pair shown in SEQ ID NO.2 is electrophoresed after PCR amplification, and the obtained DNA fragment is a 500bp DNA fragment; the molecular marker can be applied to the screening of wheat scab-resistant materials and molecular marker-assisted selection breeding, that is, through detection Whether the molecular marker exists in wheat can determine the resistance of wheat to head blight, its amplification efficiency is high, the amplification result is specific, and the breeding time can be shortened, which is suitable for popularization and application.

Description

technical field [0001] The invention belongs to the field of wheat genetic breeding and molecular biology, in particular to a molecular marker linked with wheat scab resistance QTL and application thereof. Background technique [0002] Scab is one of the major diseases of wheat worldwide, seriously affecting the yield and quality of wheat. Wheat head blight occurs in a large area in the winter wheat region in the middle and lower reaches of the Yangtze River and the spring wheat region in Northeast my country. Generally, the epidemic year can cause 5-10% yield loss, and the epidemic year can cause some fields to fail. In recent years, with changes in farming patterns and climate change, wheat head blight has spread to other major wheat producing areas in my country. In addition, the mycotoxins carried by diseased wheat grains affect the quality of seeds, endanger the health of humans and animals, and become one of the hidden dangers that threaten food security. Variety imp...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): C12Q1/6895C12N15/11
CPCC12Q1/6895C12Q2600/13C12Q2600/156
Inventor 吴磊张旭张瑜何漪姜朋马鸿翔
Owner JIANGSU ACAD OF AGRI SCI
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