Transient temperature field test method and system based on high-speed imaging technology

Abstract

The invention discloses a transient temperature field test method and system based on a high-speed imaging technology. The transient temperature field test system comprises a color high-speed camera,a medium-density optical filter, an optical lens and a computer. The transient temperature field test method comprises the steps that the optical lens focuses lightness information generated by a transient temperature field on a CMOS image sensor of the high-speed camera; the medium-density optical filter is used for controlling the light amount so that it can be guaranteed that the camera works in an unsaturated area and the upper temperature measurement limit can be expanded at the same time; the high-speed camera converts the light information which is imaged on the CMOS sensor into digitalimage RGB information; the computer analyzes the transient temperature field image information collected by the high-speed camera, and according to a temperature conversion model which is obtained through calibration of the camera and is arranged in software, the transient temperature field and related characteristic parameters can be obtained. The transient temperature field test method and system can achieve remote distance measurement of the transient temperature field, have the advantages of high time resolution and high temperature measurement upper limit, and can visually acquire a temperature distribution render graph of every moment and the related temperature characteristic parameters.

Description

technical field [0001] The invention belongs to the field of digital image processing and temperature measurement, and in particular relates to a transient temperature field testing method based on high-speed imaging technology and a testing system thereof. Background technique [0002] The duration of the transient temperature field is short, the temperature changes violently, the temperature peak value is high, and the transient high temperature field is generally accompanied by a strong destructive effect, the test environment is complex, and the technology is difficult. The traditional temperature measurement method is difficult to meet the requirements. . The test methods of transient temperature field can be generally divided into two types: contact type and non-contact type: the response frequency of contact type temperature measurement is too low, and only the temperature in the point area can be measured, and the sensor is placed in the temperature field, which is e...

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Problems solved by technology

[0002] The duration of the transient temperature field is short, the temperature changes violently, the temperature peak value is high, and the transient high temperature field is generally accompanied by a strong destructive effect, the test environment is complex, and the technology is difficult. The traditional temperature measurement method is difficult to meet the requirements.

The test methods of transient temperature field can be generally divided into two types: contact type and non-contact type: the response frequency of contact type temperature measurement is too low, and only the temperature in the point area can be measured, and the sensor is placed in the temperature field, which is easy to measure the temperature. According to the principle of temperature measurement, non-contact temperature measurement is divided into two basic types: spectral temperature measurement method and radiation temperature measurement method. Although spectral temperature measurement method can achieve high time resolution, it is easily affected by background ambient light. The interference of the temperature measurement will affect the accuracy of the temperature measurement. At the same time, this method can only measure the temperature of the point area, and the distribution of the entire temperature field cannot be obtained intuitively. The temperature measurement of the infrared thermal imager is a typical representative of the radiation temperature measurement method. Although it can Measure the distribution of the entire temperature field, but it is difficult to accurately and standardize the emissivity of the measured substance, which will affect the temperature measurement accuracy; and the frame rate of the infrared thermal imager is relatively low, which cannot meet the transient temperature field measurement Requirements for Time Resolution

[0003] Chinese patent 200910043260.6 discloses a CCD image sensor high-temperature field measuring instrument. The device obtains the R and G values ​​of each pixel of the temperature field image through the CCD sensor and then calculates the temperature. However, this method will be affected by the radiation caused by different objects The change of characteristics affects the accuracy of temperature measurement, and is limited by the CCD image sensor. The time resolution of this device is low and cannot meet the measurement requirements of the transient temperature field.

[0004] Chinese patent 201611270441.9 discloses a method and device for measuring a transient temperature field. The method uses a spectroscope to split the radiated light of the measured target into beams of multiple preset wavelength ranges, and couples the beams of multiple preset wavelength ranges. Combined with the camera system to analyze the temperature, but this method needs to have a specific understanding of the spectral characteristics of the measured object, and then formulate a reasonable wavelength preset range, which has certain limitations for the measurement of objects with unclear spectral characteristics. At the same time, the spectroscopic system It is easily affected by ambient light and distance attenuation, and its applicability in non-laboratory environments is relatively poor

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