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Photometer

A photometer and light source technology, applied in the field of photometers, can solve the problems of deterioration of optical components, short replacement life of optical components, etc., and achieve the effect of suppressing deterioration and unnecessary deterioration.

Inactive Publication Date: 2019-04-02
SHIMADZU SEISAKUSHO CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

For example, when a deuterium lamp with high ultraviolet intensity is used as a light source in a spectrophotometer, since the light energy received by the optical element is large, the replacement life of the optical element is particularly short.
In addition, in the spectrophotometer, since the light source is continuously turned on during the standby period when no measurement is performed as described above, deterioration of the optical element occurs unnecessarily.

Method used

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  • Photometer
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Embodiment Construction

[0039] Hereinafter, embodiments of the present invention will be described with reference to the attached drawings. The following embodiments are examples of actualizing the present invention, and are not intended to limit the scope of the present invention.

[0040]

[0041] refer to figure 1 An overall configuration of a photometer (here, a spectrophotometer as an example) according to the embodiment will be described. figure 1 It is a block diagram showing a schematic configuration of the spectrophotometer 100 .

[0042] The spectrophotometer 100 includes a photometry unit 10 and a control / processing unit 20 .

[0043] The photometry unit 10 includes a light source 1 . The light source 1 is constituted by, for example, a deuterium lamp.

[0044] The shielding part 2 is arranged on the optical path P of the light emitted from the light source 1 . The shielding unit 2 is an element that shields part of the incident light while transmitting the rest of the light, and ...

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Abstract

A photometer (100) provided with a light source (1) and an optical element (30) and detector (5) disposed on the optical path P of the light emitted from the light source (1), wherein the photometer is provided with: a light reduction filter (24a), which is disposed on the optical path P between the light source (1) and the optical element (30), for blocking a portion of the light emitted from thelight source (1) and allowing the remaining light to pass; and a state monitoring unit (83) for monitoring whether the light source (1) and optical element (30) are in a stable state by monitoring the light that has passed through the light reduction filter (24a) at a stage after the optical element (30).

Description

technical field [0001] The present invention relates to a photometer for measuring the transmittance, reflectance, or absorbance of a sample by irradiating light from a light source to the sample and detecting transmitted or reflected light of the light. Background technique [0002] In a spectrophotometer, which is a type of photometer, a spectrometer, a sample (or a sample cell through which a liquid / gas sample flows) and The detector is used to detect the light emitted from the light source and passed through the sample after being split by the spectrometer (or the light reflected by the sample) to determine the transmittance, reflectance, absorbance, etc. of the sample . In some cases, a spectroscope is arranged on the downstream side of the sample to split the light transmitted through the sample (or the light reflected by the sample). [0003] When a deuterium lamp or a halogen lamp is often used as a light source in a spectrophotometer, the light intensity of these ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/01G01J3/02
CPCG01N21/255G01J3/42G01J3/0213G01J3/027G01J2001/0276G01J1/0228G01J1/0418G01J3/0202G01J3/10G01N21/01G03B21/2066G01J3/02
Inventor 东郷宽之辻真二
Owner SHIMADZU SEISAKUSHO CO LTD
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