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A Dynamic Generation Method of Electronic System Fault Test Strategy

A technology for fault testing and electronic systems, applied in the direction of electronic circuit testing, etc., can solve problems such as test process influence, fault propagation model change, etc.

Active Publication Date: 2020-08-11
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] However, in the actual test process, the test results may lead to changes in the fault propagation model and affect the test process, so the dynamic test optimization method has extremely high practical value in the study of sequential testing

Method used

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  • A Dynamic Generation Method of Electronic System Fault Test Strategy
  • A Dynamic Generation Method of Electronic System Fault Test Strategy
  • A Dynamic Generation Method of Electronic System Fault Test Strategy

Examples

Experimental program
Comparison scheme
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Embodiment

[0072] figure 1 It is a flow chart of a method for dynamically generating an electronic system failure test strategy in the present invention.

[0073] In this example, if figure 1 Shown, a kind of electronic system fault test strategy dynamic generation method of the present invention comprises the following steps:

[0074] S1. Build a test model

[0075] According to the relationship between the internal fault state of the circuit and the output of the measuring point in the circuit, the test model H={D,C,P} of the circuit is constructed, where C={c 1 ,c 2 ,...,c i ,... c M} is the matrix formed by the costs corresponding to the measuring points set in the circuit, c i Indicates the prior test cost of the i-th measuring point in the circuit, M is the total number of optional measuring points; P={p 1 ,p 2 ,...,p j ,...,p N} is the matrix formed by the occurrence probability of each fault state in the circuit system, p j is the probability of occurrence of the jth f...

example

[0130] In order to illustrate the technical effect of the present invention, the present invention is verified by taking the anti-tank system as an example. Its mechatronics part involves 13 system states and 12 available measuring points, the prior probability corresponding to the fault dependency matrix, each system state, and The test cost of each measurement point is shown in Table 1. change t respectively 1 ,t 7 The cost value and s 3 ,s 6 In order to verify the effect of the algorithm proposed by the present invention, the anti-tank system is selected as an example, and at the same time, the traditional AO* algorithm is used as a comparison algorithm to calculate the example together.

[0131] Table 1 is the failure-dependency matrix of the anti-tank system;

[0132]

[0133] Table 1

[0134] When c1 increases by 0.8, the diagnosis tree constructed by the present invention is as follows figure 2 shown by figure 2 It can be seen that the present invention produc...

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Abstract

The invention discloses a method for dynamically generating electronic system fault test strategies, which dynamically modifies the cost of the node search strategy in the search tree and updates each fault in the search strategy according to the statically generated search tree and the change amount of dynamic test points or faults The optimal measurement point of the fuzzy set, and then quickly update the diagnostic tree to obtain an optimized test plan, which improves the optimization efficiency of the overall test and reduces the number of searches.

Description

technical field [0001] The invention belongs to the technical field of circuit fault diagnosis, and more specifically relates to a method for dynamically generating an electronic system fault test strategy. Background technique [0002] With the increasing development of electronic technology, the design for testability of electronic systems has become an important part of the field of electronic design. Among them, timely and accurate determination of circuit status and isolation of internal faults can effectively shorten the development, experimentation and release time of electronic systems. Therefore, the fault test scheme design is of great significance in practical applications. [0003] In the existing fault test scheme design method, the sequential test is based on the signal flow diagram given by the preliminary design and the circuit relationship described by the correlation model, and the test sequence test method is given to reduce the cost of the test, which ca...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/28
CPCG01R31/28
Inventor 刘震梅文娟杜立杨成林
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA