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Inter-pulse noise testing method and system

A noise test and noise measurement technology, which is applied in the direction of noise figure or signal-to-noise ratio measurement, can solve the problem of unable to test pulse-to-pulse noise, etc., and achieve the effect of improving the measurement range

Pending Publication Date: 2019-04-16
CHINA ELECTRONICS PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST
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Problems solved by technology

[0004] Based on this, it is necessary to provide a pulse-to-pulse noise testing method and system for the problem that traditional techniques cannot test pulse-to-pulse noise

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Embodiment Construction

[0037] In order to facilitate the understanding of the present application, the present application will be described more fully below with reference to the relevant drawings. A preferred embodiment of the application is shown in the drawings. However, the present application can be embodied in many different forms and is not limited to the embodiments described herein. On the contrary, the purpose of providing these embodiments is to make the disclosure of this application more thorough and comprehensive.

[0038] It should be noted that when an element is considered to be "connected" to another element, it may be directly connected to and integrally integrated with the other element, or there may be an intervening element at the same time. The terms "output", "input", "control" and similar expressions are used herein for the purpose of description only.

[0039] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly under...

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Abstract

The invention relates to an inter-pulse noise testing method and system. An amplifier is arranged at the rear end of a to-be-tested device, the gain of the amplifier is obtained, a spectrum analyzer measures an inter-pulse noise amplification signal to obtain an inter-pulse noise measurement result, wherein the inter-pulse noise amplification signal is obtained after the inter-pulse test signal sent by the to-be-tested device is amplified through the amplifier, on the basis of the gain and the inter-pulse noise measurement result, the inter-pulse noise is obtained, the amplifier is arranged between the to-be-tested device and the spectral analyzer so that the measuring range of the spectral analyzer can be improved, the method and the system can be applied to the measurement of the noise signal with the noise spectrum density as low as -160 dBm / Hz, and the problem that in the traditional technology, the inter-pulse noise test value is submerged below the measurement noise bottom of thespectrum analyzer so that accurate testing can not be performed is solved.

Description

technical field [0001] The present application relates to the technical field of electronic device testing, in particular to a pulse-to-pulse noise testing method and system. Background technique [0002] With the development of microwave devices, vacuum electronic devices (such as traveling wave tubes, etc.) have been widely used in modern wireless communication systems due to their large output power and wide signal coverage. In a series of parameters of high-power microwave vacuum electronic devices, pulse-to-pulse noise is a more important technical index. [0003] During the implementation process, the inventors found at least the following problems in the traditional technology: when using a spectrum analyzer to directly measure the noise of pulsed vacuum electronic devices, the test value of the intra-pulse noise is much higher than the noise floor of the spectrum analyzer, while the test value of the inter-pulse noise is much higher than the noise floor of the spectr...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R29/26
CPCG01R29/26
Inventor 宋芳芳王铁羊恩云飞黄云
Owner CHINA ELECTRONICS PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST
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