Epitaxial wafer of light-emitting diode and manufacturing method thereof, light-emitting diode
A technology for light-emitting diodes and a manufacturing method, which is applied to semiconductor devices, electrical components, circuits, etc., can solve problems such as lattice mismatch and reduce the luminous efficiency of the light-emitting layer, and achieves reduction in defect density, lattice mismatch, and non-destructive effects. Effects of Radiant Recombination Centers
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0029]In order to make the objects, technical solutions, and advantages of the present invention, the embodiments of the present invention will be further described in detail below with reference to the accompanying drawings.
[0030]figure 1 It is a schematic structural view of an epitaxial sheet of a light emitting diode according to an embodiment of the present invention. Such asfigure 1 As shown, the epitaxial sheet includes a substrate 10 and an AlN buffer layer 20, a U-type GaN layer 30, a defect blocking layer 40, a n-type layer 50, a stress release layer 60, a light emitting layer 70, and P-type layer 80. Defect blocking layer 40 is inxAlyGA1-x-y N layer, where 0 <x <1, 0 <y <1, x + y <1.
[0031]The embodiment of the present invention is formed by forming a defect blocking layer between the U-type GaN layer and the n-type layer, the defect blocking layer is in.xAlyGA1-x-y N layer, due to the lattice constant of Ga, between the AlN lattice constant and the INN lattice constant, in...
PUM
| Property | Measurement | Unit |
|---|---|---|
| thickness | aaaaa | aaaaa |
| temperature | aaaaa | aaaaa |
| thickness | aaaaa | aaaaa |
Abstract
Description
Claims
Application Information
Login to View More 


