Test probe device
A technology for testing probes and auxiliary probes, applied in the directions of measuring devices, measuring electricity, measuring electrical variables, etc., can solve the problems of large probe level, cumbersome operation, poor analysis, etc., and achieve cost saving, easy operation, and test saving. Effects of process and test time
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0055] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0056] Please refer to figure 1 , the present invention provides a test probe device, which is used to perform a slice test on the effective display area of a display panel to analyze the characteristics of thin film transistors in the real effective display area, including a bracket 1, a support member 2 that can be lifted and installed on the bracket 1, a drive The support 2 moves relative to the first drive device 3 of the bracket 1, and the test assembly...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com