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Device and method for testing pre-power short circuit protection of VR chip

A short-circuit protection and testing device technology, applied in electronic circuit testing and other directions, can solve problems such as the inability to truly reflect the working conditions of VR chips, chip breakdown and damage, and improve testing efficiency.

Active Publication Date: 2019-05-10
INSPUR SUZHOU INTELLIGENT TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] However, during the actual measurement of the NCP4552x series chips, it was found that the chip was broken down and damaged during the short-circuit protection test before power-on with the conventional test method, and the chip design manual shows that the chip has a short-circuit protection function.
Therefore, when performing short-circuit protection tests on NCP4552x series chips, using the existing technology to test is likely to cause chip breakdown and damage, which cannot truly reflect the real working conditions of VR chips, which is not conducive to improving test efficiency.

Method used

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  • Device and method for testing pre-power short circuit protection of VR chip
  • Device and method for testing pre-power short circuit protection of VR chip
  • Device and method for testing pre-power short circuit protection of VR chip

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Effect test

Embodiment 1

[0024] Such as figure 1 As shown, the technical solution of the present invention provides a short-circuit protection test device before power-on of the VR chip, including the VR chip U1 and the chip external connection circuit 10, and also includes: a voltage stabilizing module 11; the power supply terminal VCC of the VR chip U1 is connected stably The voltage output terminal of the voltage module 11, the working timing of the power supply terminal VCC of the VR chip U1 is earlier than the working timing of the first voltage input terminal VIN1 and the second voltage input terminal VIN2.

[0025] Such as figure 2 As shown, the chip external connection circuit 10 includes: VR chip U1, first input capacitor C17, second input capacitor C19, first series resistor R26, first series resistor R27, first output capacitor C16, second output capacitor C19 , the pull-up resistor R29 and the voltage stabilizing module 11; the first voltage input terminal VIN1 of the VR chip U1 is conne...

Embodiment 2

[0033] Such as Figure 4 As shown, the technical solution of the present invention also provides a short-circuit protection test method before power-on of the VR chip, which is realized based on Embodiment 1 of the present invention, including:

[0034]S1, connect the voltage output terminal of the voltage stabilizing module with the power supply terminal VCC of the VR chip, and set the working voltage;

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Abstract

The innovation of the invention proposes a device and a method for testing pre-power short circuit protection of a VR chip. By adding a voltage regulator module and adjusting the working timing of thepower supply terminal VCC and the voltage input terminal of the chip, the real working condition of the NCP4552x series chip can be truly reflected, thereby avoiding chip breakdown damage, improvingtest efficiency and reducing test costs.

Description

technical field [0001] The invention relates to the field of chip testing, in particular to a short-circuit protection testing device and method before power-on of a VR chip. Background technique [0002] During the development stage of server motherboards and other boards, it is necessary to test and verify whether the VR (Voltage Regulation, voltage regulator) chip has a short-circuit protection function. The test standard requires short-circuit before power-on, VR has protection, and short-circuit after power-on, VR has protection. [0003] At present, for the short circuit protection test before VR is powered on, it is necessary to use a load meter to perform a forced short circuit, and lead out the three signals VIN, POWERGOOD (voltage output is normal), and VOUT of the VR chip through welding flying leads, and then use three single-ended probes Connect these 3 sets of signals to the oscilloscope, and connect the other channel of the oscilloscope to the current probe t...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28
Inventor 隋鑫
Owner INSPUR SUZHOU INTELLIGENT TECH CO LTD
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