External stray light testing device and method of infrared optical system

Abstract

The invention discloses an external stray light testing device and method of an infrared optical system. The external stray light testing device comprises a light source, a collimator, a rotary table,a sliding guide rail, a first bracket, a second bracket, a lens mounting seat, a microscope system and a detector; during a test, the external stray light testing device of the infrared optical system is placed in a darkroom, light rays of the light source are reflected by a secondary reflecting mirror and main reflecting mirror in the collimator in sequence and changed into parallel beams, the collimator, the infrared optical system, the microscope system and the detector are located on a same optical axis through adjustment, the detector records image data, external stray light is introduced from different perspectives respectively, and the detector records the image data repeatedly. The external stray light testing device and method of the infrared optical system have the advantages that the principle is simple, various medium-wave infrared optical systems are in common use, the external stray light of the infrared optical system can be measured qualitatively and quantitatively, and the inhibition level of the external stray light by the infrared optical system is accurately evaluated.

Description

technical field [0001] The invention relates to the field of optics, in particular to an infrared optical system external stray light testing device and testing method. Background technique [0002] Stray light refers to the non-imaging light that reaches the image surface of the optical system. The impact on the optical system, especially the cooling infrared optical system, is mainly manifested in: the contrast of the image surface decreases, the image sharpness becomes smaller, and the image quality deteriorates, which causes MTF. Degradation and the reduction of the effective signal-to-noise ratio of the system can lead to the inability to accurately identify targets in severe cases. For cooled infrared optical systems, the level of external stray light suppression is one of the key factors to judge its imaging quality and affect the target recognition ability of the photoelectric system. [0003] Manufacturers are currently requiring space optics systems to take on mor...

AI Technical Summary

Problems solved by technology

Windows, debris, optics and even sensors can cause unintentional radiation to hit the detector

This light can overwhelm the desired signal and introduce calculation errors, greatly affecting the imaging quality of the infrared optical system

At present, there are few types of external stray light test systems for infrared optical systems, and most of them have complex systems, high prices, and cannot qualitatively and quantitatively analyze the external stray light of infrared optical systems.

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