Avalanche tolerance test device of power MOSFET device
A technology of avalanche tolerance and testing equipment, which is applied in the direction of single semiconductor device testing, etc., can solve the problems of bulky measuring equipment and high cost, and achieve the effects of cost reduction, low equipment cost and simple testing scheme
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[0026] In order to describe the present invention in more detail, the technical solution of the present invention will be described in detail below with reference to the accompanying drawings and specific embodiments.
[0027] Such as figure 1 As shown, the test device for avalanche tolerance of a power MOSFET device of the present invention includes a front-end avalanche test circuit, a back-end avalanche voltage and current sampling circuit and a control module.
[0028] The structure of the front-end avalanche test circuit 101 includes an adjustable DC power supply V, a fuse, an adjustable inductance L1, a power MOSFET device under test, and a current sampling resistor R I ; The positive pole of the adjustable DC power supply V is connected to the fuse; the other end of the fuse is connected to the inductor L1; the other end of the inductor L1 is connected to the drain of the MOSFET device under test; the source of the MOSFET device under test is connected to the current sampling...
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