Single event latch holding current test method, device and system
A single-event latch-up and current-holding technology, applied in measurement devices, environmental/reliability testing, electrical measurement, etc., can solve the problem of inability to provide data support for electronic device design, inability to accurately test single-event latch-up current, etc. problem, to achieve the effect of improving the accuracy
Active Publication Date: 2021-09-07
CHINA ELECTRONICS PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST
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Problems solved by technology
However, during the implementation process, the inventors found that there are at least the following problems in the traditional technology: the traditional technology cannot accurately test the single event latch holding current, and cannot provide data support for optimizing the design of electronic devices
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[0047] In order to make the purpose, technical solutions and advantages of the present application, the present application will be described in further detail below with reference to the accompanying drawings and examples. It should be understood that the specific embodiments described herein are intended to explain the present application and is not intended to limit the present application.
[0048] In order to solve the conventional technology can not accurately test the single event latch holding current, resulting in problems not provide support for the optimization of electronic device design, such as figure 1 Shown, a single particle of the latch holding current testing method, comprising the steps of:
[0049] Step S110, the single particle when the latch is in the device under test to monitor the occurrence of the current in the ion beam irradiation, the current acquisition device under test, and the collected current confirmation to effect current.
[0050] Incidentally...
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The present application relates to a single event latch sustaining current testing method, device and system. The method includes: collecting the current of the device under test when monitoring the single event latch-up effect of the device under test under current ion beam irradiation, and confirming the collected current as the effect current; taking the effect current as the effect current. The initial value of the input current of the device under test, and gradually reduce the input current until the device under test under the current ion beam irradiation is monitored and the single event latch-up effect is exited, and the current input current is confirmed as the corresponding value of the device under test. Exit current; obtain the exit current corresponding to the device under test in the next ion beam irradiation; confirm the minimum value of each exit current as the single event latch holding current of the device under test, thus, the application can obtain the current to be tested The single event latch-up holding current of the test device in the radiation environment is improved, the accuracy of testing the single event latch-up holding current is improved, and data support is provided for improving the anti-latch-up design of the device.
Description
Technical field [0001] Technical Field The present application relates to the reliability of electronic devices, particularly to a single event latch holding current testing method, apparatus and system. Background technique [0002] Spacecraft operating in harsh space radiation environment, the environment galactic cosmic rays, high-energy heavy ion solar cosmic rays and geomagnetic field capture band, protons and other particles will have a single event effects in an electronic system spacecraft, thereby seriously threaten the normal operation of the spacecraft. According to the US National Geophysical Data Center statistics, from 1971 to 1986, the total number of failures 39 synchronous satellite launch in the United States due to a variety of causes were 1589 times, due to radiation caused by the SEU (Single Event Upset, SEU ) and failure caused by up to 621 times, accounting for 39% of the total failure. China Academy of Space Science and Technology statistics of the cause o...
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IPC IPC(8): G01R31/00
CPCG01R31/003
Inventor 张战刚肖庆中雷志锋彭超何玉娟来萍黄云恩云飞
Owner CHINA ELECTRONICS PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST