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Monocular vision three-dimensional scanning measurement device and method based on structured light

A monocular vision and three-dimensional scanning technology, applied in the direction of measuring devices, optical devices, instruments, etc., can solve the problems of difficulty in meeting the accuracy requirements of industrial inspections and low accuracy, and achieve rapid product quality inspections, accurate three-dimensional reconstruction, easy-to-implement effects

Inactive Publication Date: 2019-07-26
CHONGQING UNIV OF POSTS & TELECOMM
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Problems solved by technology

[0003] Aiming at the problem of strapping quality inspection after steel coil packaging and bundling, if only traditional image processing methods are used, image grayscale, enhancement, denoising, filtering, segmentation, line segment detection, etc. are processed on the bundled steel coil source image Although it can also identify the number of straps in some bundled steel coil images, the accuracy is low, and it is difficult to obtain ideal image processing effects for bundled steel coil images with interference from similar colors, dust, and rust , the identification result of the number of straps is obviously difficult to meet the requirements of industrial detection accuracy
In addition, for the problems of slackness and fracture of the straps in the bundled steel coils, it is impossible to identify them only by using traditional image processing methods, so it is necessary to consider a more reasonable and effective identification method for the quality of the straps after the bundled steel coils are packaged. detection

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  • Monocular vision three-dimensional scanning measurement device and method based on structured light
  • Monocular vision three-dimensional scanning measurement device and method based on structured light
  • Monocular vision three-dimensional scanning measurement device and method based on structured light

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Embodiment Construction

[0052] The technical solutions in the embodiments of the present invention will be described clearly and in detail below with reference to the drawings in the embodiments of the present invention. The described embodiments are only some of the embodiments of the invention.

[0053] The technical scheme that the present invention solves the problems of the technologies described above is:

[0054] The present invention claims a monocular vision three-dimensional scanning measurement device and method based on structured light, wherein the device includes a laser transmitter, which is installed in a cantilever bracket, and obliquely projects the surface of the measurement target in a direction parallel to the axis of the measurement target ;Area array camera, used to extract the laser linear modulation information on the surface of the measurement target, and install a specific wavelength bandpass filter in front of the lens, the purpose of which is to ensure the quality of imag...

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Abstract

The invention relates to a monocular vision three-dimensional scanning measurement device and method based on structured light, wherein the device comprises a laser emitter, an area array camera, a CCD laser three-dimensional scanning control device, an imaging bracket, a measuring target and a computer. The method comprises the following steps that the laser emitter projects laser in a directionparallel to the axis of the measurement target; the area array camera collects the deformed laser stripe image on a measurement target, extracts the laser linear modulation information on the surfaceof the measurement target and sends the information to the computer; the computer firstly solves the phase value of the deformed laser stripe image by a Fourier transform method; the computer calculates the height of the measurement target according to the geometric relationship among the laser emitter, the area array camera and the measurement target; the computer converts the parameters of the measurement target into a three-dimensional model. The monocular vision three-dimensional scanning measurement device and method based on structured light can scan the measurement target, has the function of model restoration, can realize accurate three-dimensional reconstruction, realizes quick product quality detection, and has the advantages of high precision, high efficiency, easy implementation and the like.

Description

technical field [0001] The invention belongs to the field of machine vision, and in particular relates to a monocular vision three-dimensional scanning measurement device and method based on structured light. Background technique [0002] In social production and life, three-dimensional measurement has attracted widespread attention. Three-dimensional measurement is the basis of three-dimensional reconstruction of objects. The existing three-dimensional measurement technology is divided into two types according to different measurement methods: contact measurement and non-contact measurement. The advantage of the contact measurement method is that the measurement accuracy is high, but because it is a point contact measurement, the measurement speed will be relatively slow; secondly, it has higher requirements on the surrounding environment, such as temperature will affect its measurement accuracy; because the three-coordinate measuring instrument If the frame structure is s...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/24
CPCG01B11/24
Inventor 杨继平孟佳佳冯松赵立明
Owner CHONGQING UNIV OF POSTS & TELECOMM
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