MEMS sensor thermal parameter testing circuit and testing method
A parametric test and sensor technology, applied in optical radiation measurement, radiation pyrometry, instruments, etc., can solve the problems of device processing error, complex test system, long design cycle, etc., achieve small changes, achieve chip-level integration, speed quick effect
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[0046] The present invention will be further described below in conjunction with specific drawings and embodiments.
[0047] As the first embodiment of the first aspect of the present invention, a MEMS sensor thermal parameter test circuit based on integral operation is provided, such as figure 1 and figure 2 As shown, a thermal parameter test circuit of a diode-type infrared focal plane array sensor is taken as an example.
[0048]The MEMS sensor thermal parameter testing circuit based on the integral operation includes: a power module, a MEMS sensor array 100, an array gate switch, an operation circuit 300 and a data processing unit 400;
[0049] The MEMS sensor array 100 includes sensitive units in multiple rows and columns, and each sensitive unit will self-heat after being powered on and generate an electrical signal corresponding to its temperature. The electrical signal in this embodiment is a voltage signal;
[0050] The array selection switch is used to sequentiall...
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