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Power supply device for DUT in integrated circuit test system

A test system and integrated circuit technology, applied in the direction of electronic circuit test, measurement device, control/regulation system, etc., can solve the problem of large power dissipation of power amplifier

Active Publication Date: 2019-09-03
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The purpose of the present invention is to overcome the deficiencies in the prior art, provide a kind of power supply device for DUT in the integrated circuit test system, use the new numerical control DC power supply as the power supply of DUT, thereby solve the power amplifier dissipation in the traditional numerical control DC power supply The problem of too much power, and greatly improved the power amplifier output drive / load capacity

Method used

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  • Power supply device for DUT in integrated circuit test system
  • Power supply device for DUT in integrated circuit test system
  • Power supply device for DUT in integrated circuit test system

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Embodiment

[0027] For the convenience of description, the relevant technical terms appearing in the specific implementation are explained first:

[0028] DUT (Device Under Test): the device under test;

[0029] MCU (Microprogrammed Control Unit): microcontroller;

[0030] BUCK / BOOST: buck / boost;

[0031] figure 2 It is a schematic diagram of a power supply device for DUT in an integrated circuit test system of the present invention.

[0032] In this example, if figure 2 As shown, the present invention is a kind of power supply device used for DUT in the integrated circuit test system, comprising: PC host computer, controller MCU, isolated buck-boost circuit, power amplifier circuit and voltage / current sampling circuit; Slave controller MCU The voltage / current is output by the power amplifier circuit, then sampled by the voltage / current sampling circuit, and fed back to the controller MCU, thus forming a negative feedback loop.

[0033] image 3 It is a structural diagram of a spe...

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Abstract

The invention discloses a power supply device for a DUT in an integrated circuit test system. A PC host computer sets a preset output value of the system according to the needs of the integrated circuit test system, and sends the preset output value to a controller MCU; the controller MCU controls a chopper circuit to output a corresponding voltage value for a power amplifier according to the preset output value of the system, and the integrated circuit test system is thus controlled to operate. When the integrated circuit test system is controlled to operate, a voltage / current sampling circuit collects voltage and current values, the values are fed back to the controller MCU, the controller MCU processes the deviation value of the preset output value and the sample value through a built-in feedback control algorithm, the output voltage of a BUCK / BOOST chopper circuit is further controlled through the deviation value, and thus, the output power precision is controlled and adjusted, thepower dissipation of the power amplifier is reduced, and the load driving capability of the power amplifier is improved.

Description

technical field [0001] The invention belongs to the technical field of electronic measuring instruments and integrated circuit testing, and more specifically relates to a power supply device for DUT in an integrated circuit testing system. Background technique [0002] As the basic equipment for military and civilian scientific research and production testing, power supplies are widely used in the power electronics information industry. With the development of science and technology, scientific research and production testing put forward more requirements for the power supply. [0003] Especially, with the development of VLSI, in the integrated circuit test system, the power supply of the device under test DUT in the integrated circuit test system is required to have high power, high precision, high stability, low cost and small size. Aiming at the demand for power supply in the current scientific research and production testing, especially the demand for DUT power supply i...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G05F1/56G01R31/28
CPCG01R31/2851G05F1/56
Inventor 杨万渝黄俊戴志坚
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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