A method and device for realizing A2 Trojan detection by compatible fault scanning test
A scan test and fault test technology, applied in computer security devices, instruments, calculations, etc., can solve problems such as failure to monitor, frequent interruptions, large area overhead, etc., to reduce detection costs, reduce detection time, and high diagnosability Effect
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0061] The present invention will be further described below in conjunction with the accompanying drawings and specific preferred embodiments, but the protection scope of the present invention is not limited thereby.
[0062] like Image 6 As shown, the steps of the method for realizing the A2 Trojan horse detection by the compatible fault scanning test of the present embodiment include:
[0063] S1. Insert a multi-function controller and more than one composite ring oscillator in the gate-level netlist generation stage of the chip to be tested. The chemical units are sequentially connected into an end-to-end ring chain structure, and the working mode of the compound ring oscillator is controlled by a multi-function controller;
[0064] S2 When performing a fault test on the chip to be tested, configure a multi-function controller to make the working modes of each compound ring oscillator change alternately during the scanning shift stage to enhance the jump of suspicious sig...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com