Storage cell, memory and data writing method

A technology for writing storage units and data, which is applied in the field of memory and can solve problems such as slow memory writing speed

Active Publication Date: 2019-09-03
CETHIK GRP +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0010] The main purpose of this application is to provide a storage unit, memory and da

Method used

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  • Storage cell, memory and data writing method
  • Storage cell, memory and data writing method
  • Storage cell, memory and data writing method

Examples

Experimental program
Comparison scheme
Effect test

Example Embodiment

[0083] Example 1

[0084] Such as Picture 9 As shown, the storage unit includes a spin orbit moment providing structure 10 and two storage structures 20, which are a first storage structure and a second storage structure, respectively. The spin orbit moment providing structure 10 includes a first spin orbit moment providing line 11 With the second spin-orbit moment providing line 12, the two storage structures 20 have the same structure, such as Picture 10 As shown, it includes a free layer 21, a tunnel layer 22, and a fixed layer 23 from bottom to top. The free layer 21 of the first storage structure is arranged in contact with the first spin orbit moment providing line 11, and the free layer of the second storage structure 21 is arranged in contact with the second spin orbit moment providing line 12. Such as Picture 10 As shown, the magnetization directions of the free layer 21 and the fixed layer 23 in each storage structure 20 are perpendicular to the thickness of the stor...

Example Embodiment

[0089] Example 2

[0090] The spin orbit moment providing structure 10 is the same as that of the first embodiment. The two storage structures 20 are the first storage structure and the second storage structure. The two storage structures 20 have the same structure, such as Figure 4 As shown, it includes a free layer 21, a tunnel layer 22, and a fixed layer 23 from bottom to top. The free layer 21 of the first storage structure is arranged in contact with the first spin orbit moment providing line 11, and the free layer of the second storage structure 21 is arranged in contact with the second spin orbit moment providing line 12. Such as Figure 4 As shown, the magnetization directions of the free layer 21 and the pinned layer 23 in each storage structure 20 are perpendicular to the thickness of the storage structure 20, and both are parallel or anti-parallel to the write current direction of the spin orbit moment providing structure 10.

[0091] Each layer in each memory structure...

Example Embodiment

[0094] Example 3

[0095] The difference from Example 2 is that Figure 5 As shown, the storage structure further includes a magnetization layer 24, and the magnetization layer is used to provide a magnetic field parallel to the thickness direction of the storage structure 20 described above.

[0096] The bias magnetic field provided by the magnetization layer causes the magnetization direction of the free layer to deviate from the plane of the memory cell, that is, a symmetry break is provided. The moment of the free layer magnetic moment subjected to the equivalent field contains a horizontal component, which can ensure that the final magnetization direction of the free layer corresponds to the direction of the write current one-to-one.

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Abstract

The invention provides a storage unit, a memory and a data writing method. The storage cell includes: a spin-orbit torque providing structure, comprising two spin-orbit torque providing lines which are a first spin-orbit torque providing line and a second spin-orbit torque providing line respectively, and the spin polarization directions of spin currents generated by the first spin-orbit torque providing line and the second spin-orbit torque providing line for write currents in the same direction are different; two storage structures, respectively a first storage structure and a second storagestructure, the two storage structures being arranged at an interval, the first storage structure being arranged on the surface of the first spin-orbit torque supply line, the second storage structurebeing arranged on the surface of the second spin-orbit torque supply line, and each storage structure comprising a free layer which is in contact with the spin-orbit torque supply line. The write-inspeed of the storage unit is high.

Description

technical field [0001] The present application relates to the field of memory, and in particular, to a storage unit, a memory, and a data writing method. Background technique [0002] MTJ (magnetic tunnel junction) is a device based on the magnetic tunnel magnetoresistance (TMR) effect, generally including two magnetic layers and a dielectric layer between the magnetic layers. The magnetization orientation of the first magnetic layer is fixed (fixed layer), while the magnetization orientation of the second magnetic layer can be changed by a magnetic field or current (free layer), so that the two magnetic layers are in a parallel or antiparallel state, corresponding to a high resistance state (corresponding resistance R ap , logic state is 0) and low resistance state (corresponding to resistance R p , logic state is 1), can be used to store information. [0003] Spin Transfer Torque Magnetic Random Access Memory (STT-MRAM for short) uses current to change the state of MTJ,...

Claims

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Application Information

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IPC IPC(8): G11C11/16
CPCG11C11/161G11C11/1675
Inventor 何世坤
Owner CETHIK GRP
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