Quantum noise process analysis method and device, equipment and storage medium

A quantum noise and process analysis technology, applied in the quantum field, can solve the problems of limited quantum noise process information and insufficient accurate and comprehensive analysis of the quantum noise process, and achieve the effect of accurate and comprehensive analysis

Active Publication Date: 2019-09-06
TENCENT TECH (SHENZHEN) CO LTD
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  • Claims
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Problems solved by technology

[0004] Pure quantum process tomography, the information obtained about the quantum noise process is limited, which is not enough for accurate and comprehensive analysis of the quantum noise process

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  • Quantum noise process analysis method and device, equipment and storage medium
  • Quantum noise process analysis method and device, equipment and storage medium
  • Quantum noise process analysis method and device, equipment and storage medium

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Embodiment Construction

[0027] In order to make the purpose, technical solution and advantages of the present application clearer, the implementation manners of the present application will be further described in detail below in conjunction with the accompanying drawings.

[0028] Before introducing and describing the embodiments of the present application, some nouns involved in the present application are firstly explained.

[0029] 1. Quantum system: A part of the entire universe whose motion follows quantum mechanics.

[0030] 2. Quantum state: All information of a quantum system is represented by a quantum state ρ. ρ is a d×d matrix of complex numbers, where d is the dimensionality of the quantum system.

[0031] 3. Quantum noise process: due to the interaction between quantum systems or quantum devices and the environment, or the imperfection of the control itself leads to the pollution process of quantum information. Mathematically, this process is a channel represented by a super operator,...

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Abstract

The invention discloses a quantum noise process analysis method and device, equipment and a storage medium, and belongs to the technical field of quantum. The quantum noise process analysis method comprises the following steps: carrying out quantum process chromatography on a quantum noise process of a target quantum system to obtain dynamic mapping of the quantum noise process; extracting tensortransfer mapping of the quantum noise process from the dynamic mapping; and analyzing the quantum noise process according to the tensor transfer mapping, wherein the tensor transfer mapping is used for representing the dynamic evolution of the quantum noise process, namely, the evolution law of the dynamic mapping of the quantum noise process along with time is embodied. Therefore, the quantum noise process is analyzed based on tensor transfer mapping of the quantum noise process, and compared with pure quantum process chromatography, richer and more comprehensive information about the quantumnoise process can be obtained, so that the quantum noise process is analyzed more accurately and comprehensively.

Description

technical field [0001] The embodiments of the present application relate to the field of quantum technology, and in particular to a quantum noise process analysis method, device, equipment, and storage medium. Background technique [0002] The quantum noise process is due to the interaction of quantum systems or quantum devices with the environment, or the imperfection of the control itself leads to the pollution of quantum information. [0003] In a related art, quantum process tomography (quantum process tomography, QPT) is used to extract relevant information of a dynamic mapping of a quantum noise process. Quantum process tomography refers to reconstructing the mathematical description of the quantum noise process through a series of measurement processes by inputting a set of standard quantum states into the noise channel. [0004] The pure quantum process tomography can obtain limited information about the quantum noise process, which is not enough to analyze the quan...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/50
CPCG06F2119/10G06F30/20G06N10/40G06F30/30G06N10/70G06N7/01G06N10/00G06N20/00
Inventor 谢昌谕陈玉琴郑一聪马凯丽张胜誉
Owner TENCENT TECH (SHENZHEN) CO LTD
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