Multilayer atmospheric parameter measuring instrument

A technology of atmospheric parameters and measuring instruments, applied in measuring devices, using multiple variables to indicate weather conditions, meteorology, etc., can solve problems such as the difficulty of installing atmospheric parameter measuring instruments, and achieve high-altitude severe cold environments, easy to carry, small size effect

Pending Publication Date: 2019-10-01
NAT ASTRONOMICAL OBSERVATORIES CHINESE ACAD OF SCI
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  • Abstract
  • Description
  • Claims
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Problems solved by technology

[0006] The purpose of the present invention is to provide a multi-layer atmospheric parameter measuring instrument to solve the problem that it is very difficult to install the atmospheric parameter measuring instrument without the assistance of engineering vehicles in the high-altitude severe cold environment

Method used

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  • Multilayer atmospheric parameter measuring instrument
  • Multilayer atmospheric parameter measuring instrument
  • Multilayer atmospheric parameter measuring instrument

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Embodiment Construction

[0038] The specific implementation manners of the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. The following examples are used to illustrate the present invention, but are not intended to limit the scope of the present invention.

[0039] In the description of the present invention, it should be noted that unless otherwise specified and limited, the terms "installation", "connection" and "connection" should be understood in a broad sense, for example, it can be a fixed connection or a detachable connection. Connected, or integrally connected; it can be mechanically connected or electrically connected; it can be directly connected or indirectly connected through an intermediary, and it can be the internal communication of two components. "First", "second", "third" and "fourth" do not represent any sequence relationship, but are only distinguished for convenience of description. Those of ordinary skil...

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Abstract

The invention relates to the technical field of the atmospheric parameter measurement under high-altitude sever environment, and relates to the multilayer atmospheric parameter measuring instrument. The multilayer atmospheric parameter measuring instrument comprises an extension-type support rod, mounting brackets, multiple sensors and multiple location fixation modules arranged at the circumference of the extension-type support rod; multiple mounting brackets are arranged on the extension-type support rod from bottom to top; more than one sensors are arranged on each mounting bracket; each location fixation module comprises a fixed rope, an endless chain and a metal brazing; the first end of the fixed rope is connected with the extension-type support rod, the second end of the fixed ropeis connected with the first end of the endless chain, the second end of the endless chain is connected with the metal brazing, and the metal brazing is used for inserting into the ground. The measuring instrument disclosed by the invention is used for the quick mounting without the assistance of the engineering vehicle under the field environment, and the structure is stable.

Description

technical field [0001] The invention relates to the technical field of atmospheric parameter measurement in a high-altitude severe cold environment, in particular to a multi-layer atmospheric parameter measuring instrument. Background technique [0002] According to the requirements of astronomical observation, how to choose the site of the observatory becomes one of the key links. Since the radiation from celestial bodies passes through the earth's atmosphere before reaching the ground, the conditions of the earth's atmosphere have a great influence on astronomical observations. In terms of optical observation: cloud cover will affect the observation time; the absorption of the atmosphere will weaken the starlight; the fluctuation of atmospheric temperature and density will make the atmospheric refractive index appear uneven, causing the star image in the telescope to shake, distort or Diffusion and attenuation of starlight entering the receiver. Atmospheric absorption an...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01W1/02
CPCG01W1/02
Inventor 胡义胡柯良商朝晖马斌刘强王威
Owner NAT ASTRONOMICAL OBSERVATORIES CHINESE ACAD OF SCI
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