A wavefront error detection device and detection method based on extended Naipaul-Zernik mode optimized phase recovery
A wavefront error and phase recovery technology, which is applied in the field of optical measurement, can solve the problems of large amount of calculation, high number of samples, and difficulty in accurately determining the defocus position, so as to achieve accurate measurement and accurate determination.
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[0026] The present invention will be described in detail below with reference to the accompanying drawings and preferred embodiments, and the purpose and effect of the present invention will become clearer. It should be understood that the specific embodiments described here are only used to explain the present invention and are not intended to limit the present invention.
[0027] Such as figure 1 As shown, a wavefront error detection device based on extended Naipaul-Zernik mode optimized phase recovery, which includes a point light source 1, a half-mirror 2, a lens to be tested 3, a plane mirror 4, and an image sensor 5 , the half mirror 2 is inclined at 45 degrees behind the point light source 1, the lens to be measured 3 and the plane reflector 4 are sequentially arranged behind the point light source 1, and the point Light source 1, half-mirror 2, lens-to-be-tested 3, plane reflector 4 common optical axis, the front focus of described lens-to-be-tested 3 is positioned at ...
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