Single-shot ultrafast response process measuring system for photovoltaic device

A photovoltaic device and process measurement technology, applied in the monitoring of photovoltaic systems, photovoltaic power generation, optical instrument testing, etc., to achieve the effect of novel structure, wide application range and high time resolution

Pending Publication Date: 2019-11-01
LASER FUSION RES CENT CHINA ACAD OF ENG PHYSICS
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Problems solved by technology

[0004] In order to solve the current technical problem that it is impossible to irradiate with visible light or X-rays on the same platform, to measure the time response process and the nonlinear dynamic process at the same time, the invention provides a single-shot ultra-fast Response Process Measurement System

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  • Single-shot ultrafast response process measuring system for photovoltaic device
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  • Single-shot ultrafast response process measuring system for photovoltaic device

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Embodiment Construction

[0027] The present invention will be further described below in conjunction with embodiment and accompanying drawing.

[0028] Such as figure 1 and figure 2 As shown, a photovoltaic device single shot ultrafast response process measurement system, including beam splitter 1, folding mirror 2, nonlinear dynamic process transmission optical path, visible light time response transmission optical path, X-ray time response transmission optical path, photovoltaic device 17 and a recording module for measuring the time response of the photovoltaic device 17 and the nonlinear dynamic process, the transmission optical path of the nonlinear dynamic process has calcium fluoride 11 and a glass rod 14;

[0029] A beam of ultra-short pulse laser (100fs, adjustable energy, generally 800nm ​​wavelength) is divided into two beams by the transmission and reflection of beam splitter 1, specifically, 95% of laser transmission and 5% of laser reflection; folding mirror 2 When unfolded, a beam of...

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Abstract

The invention discloses a single-shot ultrafast response process measuring system for a photovoltaic device. The single-shot ultrafast response process measuring system comprises a beam splitter, a folding mirror, a nonlinear dynamic process transmission light path, a visible light time response transmission light path, an X-ray time response transmission light path, a photovoltaic device and a recording module. By adopting the technical scheme, a nonlinear dynamics process and the time response process of the photovoltaic device are measured in a pumping-excition mode, namely, a visible lightwave band can be used for excitation, and an X-ray can be used for excitation; the time response process and the nonlinear dynamics process of the photovoltaic device can be measured simultaneously by using a single-shot laser or X-ray excitation method for measurement; the measurement can be performed under the working state of the photovoltaic device without development of a decomposition experiment; the measurement time resolution can be adjusted according to different measurement requirements; the method has a wide application range, is suitable for photovoltaic devices, and is suitable for other similar active devices. Therefore, the method has the advantages of the high time resolution, the tunability, the wide application range and the like.

Description

technical field [0001] The invention relates to the technical field of ultrafast response process measurement of photovoltaic devices, in particular to a single ultrafast response process measurement system for photovoltaic devices. Background technique [0002] The absorption of PbS quantum dots is in the near-infrared band, while the absorption of AgInZnS quantum dots is in the visible light band. The combination of the two can ensure that different wavelength components in sunlight can be absorbed and utilized. In addition, the quantum dots contain Pb with high atomic number, which makes the device have obvious response to X-ray irradiation. Therefore, photovoltaic devices based on PbS and AgInZnS quantum dots have broad application prospects in the visible and X-ray bands, and can be used in solar cells, visible light detectors, and X-ray detectors. The time response process of a photovoltaic device is an important indicator of the device, and the measurement is general...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01M11/04G01M11/02H02S50/15
CPCG01M11/0207G01M11/04H02S50/15Y02E10/50
Inventor 刘祥明理玉龙徐涛彭晓世刘永刚魏惠月关赞洋王峰
Owner LASER FUSION RES CENT CHINA ACAD OF ENG PHYSICS
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