SoC type integrated circuit dynamic ageing device and method

An integrated circuit and aging technology, which is applied in the field of SoC type integrated circuit dynamic aging device, can solve the problems of height adjustment, signal depth cannot be freely programmed, insufficient number of excitation signals, etc., and achieves the effect of improving the reliability of use.

Inactive Publication Date: 2019-11-12
西安太乙电子有限公司
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  • Abstract
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  • Application Information

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Problems solved by technology

[0004] The technical problem to be solved by the present invention is to provide a SoC-type integrated circuit dynamic burn-in device and method for the above-mentioned deficiencies in the prior art, which overcomes the shorta

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  • SoC type integrated circuit dynamic ageing device and method
  • SoC type integrated circuit dynamic ageing device and method
  • SoC type integrated circuit dynamic ageing device and method

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Embodiment Construction

[0028] The present invention provides a SoC type integrated circuit dynamic burn-in device, comprising a power supply module 1, a signal source module 2, a program memory module 3, an online debugging module 4, an output indication module 5 and a thermal stress control module 6, the power supply module 1, The signal source module 2 , the program memory module 3 , the online debugging module 4 and the thermal stress control module 6 are respectively connected to the SoC device 7 , and the SoC device outputs the test results through the output instruction module 5 .

[0029] The power module 1 can provide 4 low-voltage power supplies at the same time, and the power-on sequence can be adjusted. Each power supply can provide a load capacity of 2.0A, which can meet the power-on requirements of various SoC devices 7 .

[0030] The signal source module 2 is used to send a signal excitation source, and a large FPGA is used to form the number of signals required by the SoC device, and t...

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Abstract

The invention discloses a SoC type integrated circuit dynamic ageing device and method. A SoC device is connected with each of a power module, a signal source module, a program memorizer module, an online debugging module, an output indication module and a heat stress control module; the power module can provide multiple paths of low-voltage power supplies at the same time; the signal source module is used for sending out an signal excitation source; the program memorizer module performs storage by adopting a general NORFLASH; the online debugging module realizes the device detailed test result output and the online debugging function through computer serial debugging software; the output indication module drives an LED light-emitting tube to perform indication by utilizing the SoC generaloutput interface; and the heat stress control module is used for temperature detection and radiation processing. The invention can provide the ageing method of the system for the SOC type device, thedynamic ageing problem of the device is solved, so that the device can apply enough electric stress under a specified environment, and the early failure of the device can be exposed as early as possible, the high-temperature dynamic ageing aim is reached, and the use reliability of the device is improved.

Description

technical field [0001] The invention belongs to the technical field of aging screening tests, and in particular relates to a SoC type integrated circuit dynamic aging device and method. Background technique [0002] SoC is the abbreviation of System on Chip. It is called system-on-chip or system on chip. It is the chip integration at the core of the information system, which integrates the key components of the system on a chip to form a product. [0003] see figure 1 , SoC products have the characteristics of high integration, high intelligence, and miniaturization. Therefore, most devices have many pins and complex functions. They require many excitation signals during burn-in, and require low-voltage power supply (generally lower than 2.0V) as the core power supply. Power supply, while the existing domestic integrated circuit equipment can provide a maximum of 64 signals, but can only provide 2 channels of power, and the minimum starting power supply is 2.0V, which is fa...

Claims

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Application Information

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IPC IPC(8): G01R31/28
CPCG01R31/2868G01R31/2874
Inventor 赵五喜邵勇孟楠张燕王爱红
Owner 西安太乙电子有限公司
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