Laser etching processing-oriented pattern segmentation method and laser etching control system

A laser etching and graphics technology, which is applied in laser welding equipment, metal processing equipment, 3D image processing, etc., can solve problems such as difficulty in ensuring pattern processing accuracy, difficulty in meeting processing requirements, and limited scope of application.

Active Publication Date: 2019-11-22
XIDIAN UNIV
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Problems solved by technology

[0003] To sum up, the problems existing in the existing technology are: the applicable range of the existing laser processing method for the surface pattern of the large-scale three-dimensional mesh model is very limited, and it is difficult to guarantee the processing accuracy of the pattern when the curvature of the surface changes greatly. Most of the graphic elements to be processed at the same time are mainly line segments, which is difficult to meet the actual processing needs

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  • Laser etching processing-oriented pattern segmentation method and laser etching control system
  • Laser etching processing-oriented pattern segmentation method and laser etching control system
  • Laser etching processing-oriented pattern segmentation method and laser etching control system

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Embodiment Construction

[0110] In order to make the object, technical solution and advantages of the present invention more clear, the present invention will be further described in detail below in conjunction with the examples. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0111] Aiming at the problems existing in the prior art, the present invention provides a pattern segmentation method for laser etching processing and a laser etching control system. The present invention will be described in detail below with reference to the accompanying drawings.

[0112] Such as figure 1 As shown, the pattern segmentation method for laser etching processing provided by the embodiment of the present invention includes the following steps:

[0113] S101: Calculating the normal vector of the texture point: according to the texture point, search for a suitable triangle patch from the three-dimensional mesh...

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Abstract

The invention belongs to the technical field of laser etching, and discloses a pattern segmentation method for laser etching processing, and a laser etching control system, and the method comprises the steps: calculating a normal vector of a mapping point; winding the two-dimensional vector maps on the surface of the three-dimensional grid model, calculating a transformation matrix of each two-dimensional vector map, and winding the maps on the surface of the three-dimensional grid model based on a geometric transformation principle; determining a search range according to the scanning range of the scanning galvanometer and the maximum focal depth, and obtaining a mapping pattern associated with each processing area; for one processing area, determining a segmentation plane according to the position of the central point, projecting the boundary line of the processing area and the associated pattern onto the segmentation plane, and segmenting the pattern; and according to the back projection coordinate system, generating a machinable file required by the machining party. The moving times of the scanning galvanometer in a traditional method can be effectively reduced, and the actualmachining efficiency is improved; and the pattern of each processing area can be efficiently segmented, and meanwhile, the precision of the pattern is ensured.

Description

technical field [0001] The invention belongs to the technical field of laser etching, and in particular relates to a pattern segmentation method for laser etching processing and a laser etching control system. Background technique [0002] With the continuous development of laser etching processing technology, the processing technology of large-scale and complex model surface patterns has become a very important technical requirement. Nowadays, the shape of the model to be processed is becoming more and more complex, and the format is getting larger and larger. When the texture pattern is small, more texture points are required. In this case, the five-axis motion mechanism of the laser etching system will frequently Move to determine the position of the next processing pattern, so that the actual processing efficiency is low. At this time, a larger texture pattern is usually used to reduce the number of texture points. However, when a larger textured pattern is introduced,...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/50G06T15/04G06T17/20B23K26/362
CPCG06T15/04G06T17/20B23K26/362Y02P90/30
Inventor 李广鑫于慧强
Owner XIDIAN UNIV
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