Method for analyzing defect type through scanning electron microscope and microscope

A technology of scanning electron microscopy and defect types, which is applied in the direction of analyzing materials, using wave/particle radiation for material analysis, testing metal components, etc., and can solve problems such as inaccurate determination and inability to find solutions

Pending Publication Date: 2019-12-03
QINGDAO HUAXIANG AVIATION TECH
View PDF4 Cites 3 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The purpose of the present invention is to provide a method for analyzing defect types through scanning electron microscope and microscope, so as to solve the problem in the field of precision casting mentioned above in the background technology that there are often various defects on the surface of parts. At present, there is no more scientific way to analyze Its precise determination makes it impossible to find an effective solution to the problem

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for analyzing defect type through scanning electron microscope and microscope
  • Method for analyzing defect type through scanning electron microscope and microscope
  • Method for analyzing defect type through scanning electron microscope and microscope

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0056] 1. Preliminary judgment is made on the surface defect of the casting, the defect position is displayed with fluorescence, and the defect position is made into a gold image, such as Figure 8 ;

[0057] 2. Use a scanning electron microscope to observe the tissue morphology at 50-1000 times

[0058] 1) Observe its morphological structure: such as Figure 9 , which has no fixed shape and rough edges, and is preliminarily determined to be oxidized slag inclusions;

[0059] 2) if Figure 10 , it can be found that the composition of the defect area is different from that of the base metal, which is in line with the characteristics of oxidized slag inclusions;

[0060] 3) Surface scanning is enriched at the same position, such as Figure 11 As shown, the defect area mainly contains Al and O elements, and more Cr and Nb elements are also detected in the defect area. The detected elements and percentages are shown in the following table:

[0061]

[0062] 3. Conclusion: Th...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a method for analyzing a defect type through a scanning electron microscope and a microscope in the technical field of precision casting. The method comprises the following steps: 1) preliminarily judging the surface defect of a casting to confirm whether the defect is shrinkage porosity or not; 2) performing metallographic confirmation on the defect position by using the electron microscope and the scanning electron microscope; and 3) carrying out comparison according to the morphological characteristics and the element content of the defect to determine the defect type. In the step 1), formation reason and the judgment method of the shrinkage porosity are as follows: formation reason: since a final solidification area of the casting is not fed by liquid metal or alloy, dispersed and fine shrinkage cavities are formed, and the alloy liquid is divided into a plurality of small closed areas; and when the alloy liquid in the closed areas is solidified and shrunk and cannot be supplemented, shrinkage porosity is caused. The problem that the defect type and the defect cause reason cannot be judged can be solved.

Description

technical field [0001] The invention relates to the technical field of precision casting, in particular to a method for analyzing defect types through a scanning electron microscope and a microscope. Background technique [0002] Precision casting refers to the general term for the process of obtaining precise size castings. Compared with the traditional sand casting process, the size of the castings obtained by precision casting is more accurate and the surface finish is better. It includes: investment casting, ceramic casting, metal casting, pressure casting, lost foam casting. [0003] Precision casting is also called lost wax casting. Its products are precise, complex, and close to the final shape of the parts. They can be used directly without or with little processing. It is an advanced technology near net shape. [0004] In the field of precision casting, there are often various defects on the surface of parts. At present, there is no more scientific way to accurate...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01N33/2045G01N33/202G01N23/2251G01N23/2202
CPCG01N23/2202G01N23/2251G01N2223/09G01N2223/102G01N2223/602G01N2223/605G01N2223/624G01N33/202G01N33/2045
Inventor 高杰徐超袁德贝
Owner QINGDAO HUAXIANG AVIATION TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap