Artificial nerve synaptic device and preparation method thereof
A technology of synaptic devices and artificial nerves, applied in the field of bionic electronics, can solve problems such as inability to simultaneously realize associative learning-related characteristics, complex circuit structure, and complex input signals
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Embodiment 1
[0040] This embodiment provides an artificial synapse device, figure 1 It is a structural schematic diagram of the artificial synaptic device, and the artificial synaptic device includes a first electrode layer 11, a second electrode layer 13, and an Between the functional layer 12.
[0041] Specifically, the first electrode layer 11 is used as a bottom electrode, and its material may be an inert conductive material such as Pd, Pt, ITO, W or Au. Further, the thickness of the first electrode layer 11 is 10 nm to 200 nm.
[0042] The resistive switching device prepared based on the material of the functional layer 12 has both unidirectional resistive switching characteristics and bidirectional resistive switching characteristics. The unidirectional resistive switching characteristic is also called unipolar resistive switching behavior, which means that the resistive switching behavior does not depend on the polarity of the applied voltage. Assuming that the initial state of t...
Embodiment 2
[0049] Based on the same inventive concept, this embodiment provides a planar integration method for preparing the artificial synapse device provided in Embodiment 1, the preparation method of the artificial synapse device includes steps S11 to S15.
[0050] S11, providing a semiconductor substrate.
[0051] Such as Figure 8a As shown, the semiconductor substrate 81 may be a silicon substrate.
[0052] S12, depositing an isolation layer on the surface of the semiconductor substrate.
[0053] Such as Figure 8b As shown, the isolation layer 82 is deposited on the surface of the semiconductor substrate 81 by chemical vapor deposition or thermal oxidation. The material of the isolation layer 82 can be SiO 2 Or SiN, which can be 100nm to 300nm thick. Of course, the thickness of the isolation layer 82 may also be reduced or increased according to actual process conditions, which is not limited in this embodiment.
[0054] S13, depositing the first electrode layer on the surf...
Embodiment 3
[0061] Based on the same inventive concept, this embodiment provides a method for vertically integrating the preparation of the artificial synapse device provided in Embodiment 1, the preparation method of the artificial synapse device includes steps S21 to S27.
[0062] S21, providing a semiconductor substrate.
[0063] Such as Figure 9a As shown, the semiconductor substrate 91 may be a silicon substrate.
[0064] S22, depositing a first isolation layer on the surface of the semiconductor substrate.
[0065] Such as Figure 9b As shown, the first isolation layer 92 is deposited on the surface of the semiconductor substrate 91 by chemical vapor deposition or thermal oxidation. The material of the first isolation layer 92 can be SiO 2 Or SiN, which can be 100nm to 300nm thick. Of course, the thickness of the first isolation layer 92 may also be reduced or increased according to actual process conditions, which is not limited in this embodiment.
[0066] S23. Deposit the ...
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Abstract
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