System and method of detecting defect in display screen by using equal-thickness interference principle

A technology of interference system and display screen, which is applied in the field of optical detection, can solve the problems of multiple detection steps, achieve high detection efficiency, prevent missed detection of defects or impurities, and achieve high detection accuracy

Active Publication Date: 2019-12-27
ANHUI UNIVERSITY OF TECHNOLOGY
View PDF9 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This scheme only detects impurities for rectangular display screens with arc corners. Although the effect of detecting impurity information in round-corner display screens is improved, it is necessary to first obtain the noise information in the smallest circumscribed rectangular image containing the target display screen. The surroundings of the display screen are the background, and then the noise information in the area where the four corners are located is removed. There are many detection steps, and the detection is mainly for the display screen with a relatively small size.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • System and method of detecting defect in display screen by using equal-thickness interference principle
  • System and method of detecting defect in display screen by using equal-thickness interference principle
  • System and method of detecting defect in display screen by using equal-thickness interference principle

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0036] combine Figure 1 to Figure 3A system for detecting defects in a display screen using the principle of equal-thickness interference in this embodiment includes a scanning system, an interference system, and an optical microscope module. The scanning system includes a scanning bracket and a light source part and an imaging part connected to the scanning bracket. The light source Part of the emitted light is used to irradiate the interference system to generate interference fringes. The interference system includes the test glass slide 4-1 and the flat slide 4-2 placed on the bottom of the test slide 4-1, the test slide 4-1 and A clamp 4-5 is set between the flat glass slides 4-2 to form an air wedge, the scanning bracket is used to adjust the outgoing light and scan the test glass slide 4-1 horizontally and vertically, and the optical microscope module is connected with the camera part to observe and Record the change of interference fringes.

[0037] Further, in this e...

Embodiment 2

[0051] A method for detecting defects in a display screen using the principle of equal-thickness interference in this embodiment, its steps are basically the same as in Embodiment 1, further, this embodiment sets the clamping block 4-5 according to the length a of the glass slide 4-1 to be tested The height h of h / a=0.005~0.015, specifically in this embodiment, the glass slide 4-1 to be tested is a square with a side length of 2m, and the height of the clip 4-5 is calculated according to the above formula to be 10mm~30mm, in this embodiment The height of the middle clamping block 4-5 is 30mm, that is, the maximum thickness of the entire air wedge is 30mm, and the laser 2-4 in this embodiment is a green laser with a wavelength of 532nm.

[0052] As the thickness of clamping block 4-5 increases, the fringe width decreases proportionally. In order to make the interference fringes formed by the interference system easy to observe and calculate, the height of clamping block 4-5 shou...

Embodiment 3

[0054] In this embodiment, a system for detecting defects in a display screen using the equal-thickness interference principle is basically the same in structure as in Embodiment 1. Further, the light source part of this embodiment is fixed by the first connecting rod 2-3 and the fixing rod 1-3. Connected, the camera part is fixedly connected with the fixed rod 1-3 through the second connecting rod 3-6. Due to the large size of the glass display screen, if an external fixed light source is used to scan and detect a square display screen with a size of about 2m, the structure of the required fixed light source is large, and it consumes energy and wastes energy. In this embodiment, the fixed rod 1-3 can move horizontally along the sliding rod 1-1 along with the telescopic rod 1-2, and the relative position of the light source part and the camera part remains unchanged, thereby realizing the synchronous movement of the light source part and the camera part. Part of it can provide...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a system and method of detecting a defect in a display screen by using an equal-thickness interference principle, and belongs to the technical field of optical interference detection. An air wedge is formed between a to-be-tested glass sheet and a flat glass sheet, parallel light penetrates through the air wedge and produces interference stripes, if the to-be-tested glass sheet has a defect or impurity, the interference stripes deform, stripe order and stripe width are calculated are calculated in x and y directions respectively so as to obtain specific position coordinates of the defect, then the defect is processed and cut in later stage. Through adoption of the system and method, higher detection accuracy is realized, simple, convenient operation is realized, defects or impurities are not missed, and complete, flawless glass display screen is obtained.

Description

technical field [0001] The invention belongs to the technical field of light detection, and more specifically relates to a system and method for detecting defects in a display screen by utilizing the equal-thickness interference principle. Background technique [0002] In order to allow users to intuitively know the operating status of electronic equipment, or to allow users to control electronic equipment conveniently, electronic equipment is usually equipped with different display screens. The quality of the display screen is related to the quality of the original glass. The requirements are various. The original glass sheet is recut after being tested for impurities, and then undergoes a series of processing to obtain a display screen that meets the requirements. Moreover, impurities may remain on the display screen during the manufacturing and installation of the equipment, which may affect the quality of the display screen. For example, sticking a film on the display sc...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/95G01N21/45G01N21/01
CPCG01N21/95G01N21/45G01N21/01G01N2021/0112
Inventor 贾虎刘义莫绪涛张涛丁成祥杨辉
Owner ANHUI UNIVERSITY OF TECHNOLOGY
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products