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Two-dimensional material probe for atomic force microscope and its preparation method and application

An atomic force microscope, two-dimensional material technology, applied in scanning probe technology, scanning probe microscopy, nano-carbon, etc., can solve the problems of high chance, easy detachment of graphene, and difficult friction experiments.

Active Publication Date: 2021-05-14
TSINGHUA UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, the preparation process of these two types of methods is complicated and the cost is high.
The third method is to directly adsorb graphene on the tip of the atomic force microscope through friction transfer technology, but this method is more accidental, and the graphene is easy to fall off during the movement of the tip, and the stability is poor, so it is difficult to use in related friction experiments

Method used

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  • Two-dimensional material probe for atomic force microscope and its preparation method and application
  • Two-dimensional material probe for atomic force microscope and its preparation method and application
  • Two-dimensional material probe for atomic force microscope and its preparation method and application

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Embodiment Construction

[0035] Embodiments of the present invention are described in detail below, examples of which are shown in the drawings, wherein the same or similar reference numerals designate the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the figures are exemplary and are intended to explain the present invention and should not be construed as limiting the present invention.

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Abstract

The invention discloses a two-dimensional material probe for an atomic force microscope, a preparation method and an application thereof. Wherein, the two-dimensional material probe includes: a cantilever beam, a hard ball and a two-dimensional material layer, the upper part of the hard ball is fixedly connected with the tip of the cantilever beam; the two-dimensional material layer is adhered to The bottom of the hard pellet. The two-dimensional material probe has a simple and stable structure, fast preparation speed and low cost, and is very suitable for friction experiments related to a specific two-dimensional material.

Description

technical field [0001] The invention belongs to the field of atomic force microscopy, and in particular relates to a two-dimensional material probe for atomic force microscopy, a preparation method and application thereof. Background technique [0002] Friction and wear are the two main obstacles to improving the efficiency of mechanical systems, which will lead to a large amount of unnecessary energy dissipation and damage to parts and components. Therefore, in the design of high-performance micro-electromechanical systems or nano-electromechanical systems, it is required near zero friction and extremely low wear. Super-slip refers to the lubrication state when the friction coefficient drops to 0.001 or even lower, and it is an effective method to achieve near-zero friction. Due to the weak interlayer van der Waals interaction of graphene and other two-dimensional layered materials, they can achieve superslip under certain conditions, and their superslip properties have be...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01Q60/38C01B32/19
CPCC01B32/19G01Q60/38
Inventor 李津津李鉴峰刘大猛
Owner TSINGHUA UNIV
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