Hot-swap system and method for on-site testing of bus function modules

A field test, functional module technology, applied in general control systems, control/regulation systems, simulators, etc., can solve the problems of not fully meeting requirements, waste of resources, and high costs, to achieve protection, solve thermal shock problems, reduce cost effect

Active Publication Date: 2020-11-06
NAVAL UNIV OF ENG PLA
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Although there are many types of hot-swap control chips currently on the market, when the hot-swap control chips with fixed parameters are applied to specific circuits, they cannot fully meet the needs, or the performance is too high, resources are wasted, and the cost is high.

Method used

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  • Hot-swap system and method for on-site testing of bus function modules

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Embodiment Construction

[0030] Below in conjunction with accompanying drawing and specific embodiment the present invention is described in further detail:

[0031] Such as figure 1 Shown is a kind of hot-swappable system that is used for field test bus functional module, and it comprises controller 1 (controller 1 is made of single-chip microcomputer system) and the hot-swappable unit 3 of field test bus functional module, described field test bus The hot-swappable unit 3 of the functional module includes an MCU 3.1, an output voltage monitoring module 3.2, a MOSFET driver module 3.3, an input current monitoring module 3.4 and a MOSFET tube 3.5, and the controller 1 is used to connect the controller 1 and the Status monitoring line v between MCU3.1 sm , so that the MCU3.1 access state information communication and MCU3.1 identity identification are performed between the controller 1 and the MCU3.1;

[0032] The controller 1 is also used to transmit a control signal for switching on the MOSFET to t...

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Abstract

The invention discloses a hot plug system and a hot plug method for a field test bus function module. The hot plug system comprises a controller, wherein the controller is connected with a state monitoring line between the controller and an MCU by means of a field test bus; the controller transmits a control signal for switching on MOSFET to a MOSFET driving module by means of the field test bus;a source electrode voltage output end of the MOSFET driving module is connected with a source electrode of the MOSFET; a gate voltage output end of the MOSFET driving module is connected with a gate electrode of the MOSFET; a drain electrode of the MOSFET supplies power to the field test bus function module; an output voltage monitoring module monitors a power supply voltage of the field test busfunction module and feeds back the power supply voltage to the MCU; and an input current monitoring module detects an input current input to the source electrode of the MOSFET by means of the field test bus and feeds back the input current to the MCU. Compared with a traditional hot plug method, the hot plug system and the hot plug method have the advantages of being flexible in parameter setting,small in size, low in cost, good in safety and stability and the like.

Description

technical field [0001] The invention relates to the technical field of on-site automatic testing, in particular to a hot-swapping system and method for on-site testing of bus function modules. Background technique [0002] As one of the key technologies of automatic testing, the test bus's performance determines the quality of the test results to a certain extent. Hot plugging is an important function of the test bus, which mainly realizes the protection and identification of functional modules. [0003] Hot-swap technology allows system protection, failure recovery, and system reconfiguration with no downtime or minimal operator involvement. Generally, modules without hot-swappable design do not support hot-swappable. Because there are inductance and capacitance in the module circuit, plugging and unplugging with power will bring great surge current, instantaneous voltage, static electricity and other hazards to the circuit. The transient voltage generated on the signal ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G05B19/042
CPCG05B19/0423G05B2219/24215
Inventor 朱利文陈盼辉刘明辉金传喜张龙飞毛伟
Owner NAVAL UNIV OF ENG PLA
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