Low-temperature- drift under-voltage locking circuit

An undervoltage lockout circuit and low-temperature drift technology, which is applied to circuit devices, protection against undervoltage or no voltage, emergency protection circuit devices, etc., can solve the problem of unstable performance of undervoltage lockout circuits, large temperature drift, The required area is large, etc., to achieve the effect of small temperature drift characteristics, small occupied area, and reduced circuit power consumption

Inactive Publication Date: 2020-03-06
INST OF MICROELECTRONICS CHINESE ACAD OF SCI
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] The invention provides a low-temperature drift under-voltage lockout circuit, which solves the technical problems of the under-voltage lockout circuit in the prior art that the working performance is unstable, the required area is large, the power consumption is high, and the temperature drift is large.

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  • Low-temperature- drift under-voltage locking circuit

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Embodiment Construction

[0028] The embodiments of the present application provide a low-temperature drift under-voltage lockout circuit to solve the technical problems of unstable working performance, large area required, high power consumption, and large temperature drift of the under-voltage lockout circuit in the prior art.

[0029] In order to better understand the above technical solutions, the above technical solutions will be described in detail below in conjunction with the accompanying drawings and specific implementation methods. It should be understood that the embodiments of the present invention and the specific features in the embodiments are detailed descriptions of the technical solutions of the present application. , rather than limiting the technical solutions of the present application, the embodiments of the present application and the technical features in the embodiments can be combined without conflict.

[0030] see figure 2 , a low temperature drift undervoltage lockout circu...

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Abstract

The invention belongs to the technical field of analog integrated circuits, and discloses a low-temperature-drift under-voltage locking circuit. The locking circuit comprises a sampling circuit for sampling a power supply voltage and outputting a sampling voltage signal; a band-gap reference circuit for generating band-gap reference voltage and receiving the sampling voltage signal; a current mirror circuit for mirroring the currents of the two branches of the band-gap reference circuit and comparing the sampling voltage signal with the band-gap reference voltage to output a comparison signal;and an output buffer circuit which receives, amplifies and shapes the comparison signal. The low-temperature-drift under-voltage locking circuit provided by the invention has the advantages of simplestructure, small occupied area, low power consumption and small temperature drift.

Description

technical field [0001] The invention relates to the technical field of analog integrated circuits, in particular to a low-temperature drift undervoltage lockout circuit. Background technique [0002] The undervoltage protection circuit is very important for power management chips and driver chips. When the power supply voltage drops below the minimum voltage required for the normal operation of the system, some circuit functions will be damaged, some analog circuit modules will not work normally, and digital logic circuits may output unpredictable states. Usually, an undervoltage lockout circuit is used to monitor the power supply voltage. When the power supply voltage is lower than the minimum voltage required for the normal operation of the system, the undervoltage lockout voltage outputs a control signal to shut down the system. The circuit is turned on and off repeatedly, and a certain amount of hysteresis needs to be set. When the power supply voltage exceeds a certain...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H02H3/24H02H1/00
CPCH02H1/0007H02H3/24
Inventor 张小琴曾传滨蔡小五赵海涛刘海南罗家俊
Owner INST OF MICROELECTRONICS CHINESE ACAD OF SCI
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