Calibration device, system and method for relay comprehensive testing instrument
A technology for calibrating devices and relays, which is applied to measuring devices, instruments, and measuring electrical variables. It can solve problems such as the inability to accurately set the bounce time interval point of the relay comprehensive tester, and the inability to cover the entire range, so as to improve calibration accuracy. The effect of high time signal resolution
Active Publication Date: 2022-02-25
GUIZHOU AEROSPACE INST OF MEASURING & TESTING TECH
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Problems solved by technology
[0015] In view of this, the purpose of the present invention is to provide a calibration device, system and method for a comprehensive relay tester to solve the problem of inability to accurately set the bounce time interval points to be calibrated for a comprehensive relay tester in the prior art, especially the bounce time The upper and lower limits of the measurement, resulting in the problem that the calibrated points cannot cover the entire range
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[0076] Reference will now be made in detail to the exemplary embodiments, examples of which are illustrated in the accompanying drawings. When the following description refers to the accompanying drawings, the same numerals in different drawings refer to the same or similar elements unless otherwise indicated. The implementations described in the following exemplary examples do not represent all implementations consistent with the present invention. Rather, they are merely examples of apparatuses and methods consistent with aspects of the invention as recited in the appended claims.
[0077] Figure 5 It is a schematic circuit diagram of a calibration device for a comprehensive relay tester shown according to an exemplary embodiment, as shown in Figure 5 As shown, the device includes:
[0078] The logic gate module is connected with a function / arbitrary waveform generator, and is used to generate switch control signals driven by the delay signal generated by the function / a...
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The present invention relates to a calibration device, system and method for a relay comprehensive testing instrument, the device comprising: a logic gate module connected with a function / arbitrary waveform generator, used for delay generated by the function / arbitrary waveform generator Driven by the signal, a switch control signal is generated; the switch module is used to turn on or off under the drive of the switch control signal, so as to simulate the pull-in bounce time and release bounce time of the relay, so as to realize the pull-in of the relay comprehensive tester Calibration of closing bounce time and release bounce time. In the technical solution provided by the present invention, because the function / arbitrary waveform generator has an external trigger delay function, and the calibration device can simulate the bounce of various relays with different bounce time intervals, it solves the problem that the prior art cannot accurately set the calibration The pull-in release bounce time interval point, which causes the problem that the calibrated point cannot cover the entire range.
Description
technical field [0001] The invention relates to the technical field of measuring instrument calibration, in particular to a calibration device, system and method for a comprehensive relay tester. Background technique [0002] The relay comprehensive tester is mainly composed of time measurement unit, voltage measurement unit, current measurement unit, resistance measurement unit, coil power supply, test fixture and computer. The relay comprehensive tester is a comprehensive tester for testing the pull-in time, release time, pull-in bounce time, release bounce time, coil resistance, contact resistance, voltage, current and other parameters of the relay. [0003] The pull-in bounce time refers to the time interval from the first closing of the changeover contact and the normally open contact to the last stable closing after the relay coil is energized. The release bounce time refers to the time interval from the first separation of the changeover contact and the normally open...
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IPC IPC(8): G01R35/00
CPCG01R35/007
Inventor 瞿明生刘兴石竹君郑静袁文赵中泽
Owner GUIZHOU AEROSPACE INST OF MEASURING & TESTING TECH